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Sudeb Dasgupta
Sudeb Dasgupta
Department of Electronics and Communication Engineering, IIT Roorkee
Verified email at iitr.ac.in
Title
Cited by
Cited by
Year
Device and circuit co-design robustness studies in the subthreshold logic for ultralow-power applications for 32 nm CMOS
R Vaddi, S Dasgupta, RP Agarwal
IEEE Transactions on Electron Devices 57 (3), 654-664, 2010
191*2010
Effect of well and substrate potential modulation on single event pulse shape in deep submicron CMOS
S DasGupta, AF Witulski, BL Bhuva, ML Alles, RA Reed, OA Amusan, ...
IEEE Transactions on Nuclear Science 54 (6), 2407-2412, 2007
1312007
Nanoscale FinFET based SRAM cell design: Analysis of performance metric, process variation, underlapped FinFET, and temperature effect
B Raj, AK Saxena, S Dasgupta
IEEE Circuits and Systems Magazine 11 (3), 38-50, 2011
1232011
A Comparative Study of 6T, 8T and 9T Decanano SRAM cell
P Athe, S Dasgupta
2009 IEEE Symposium on Industrial Electronics & Applications 2, 889-894, 2009
952009
Antifungal Activity of Some Plant Extracts Against Fungal Pathogens of Tea (Camellia sinensis.)
D Saha, S Dasgupta, A Saha
Pharmaceutical biology 43 (1), 87-91, 2005
942005
Surface potential and drain current analytical model of gate all around triple metal TFET
N Bagga, S Dasgupta
IEEE Transactions on Electron Devices 64 (2), 606-613, 2017
822017
High-performance and robust SRAM cell based on asymmetric dual-k spacer FinFETs
PK Pal, BK Kaushik, S Dasgupta
IEEE Transactions on Electron Devices 60 (10), 3371-3377, 2013
762013
Investigation of symmetric dual-k spacer trigate FinFETs from delay perspective
PK Pal, BK Kaushik, S Dasgupta
IEEE Transactions on Electron Devices 61 (11), 3579-3585, 2014
752014
Design and analysis of analog performance of dual-k spacer underlap N/P-FinFET at 12 nm gate length
A Nandi, AK Saxena, S Dasgupta
IEEE transactions on electron devices 60 (5), 1529-1535, 2013
722013
Demonstration of a novel two source region tunnel FET
N Bagga, A Kumar, S Dasgupta
IEEE Transactions on Electron Devices 64 (12), 5256-5262, 2017
682017
Recent trend of FinFET devices and its challenges: A review
RS Pal, S Sharma, S Dasgupta
2017 Conference on Emerging Devices and Smart Systems (ICEDSS), 150-154, 2017
672017
Analytical modeling of a double gate MOSFET considering source/drain lateral Gaussian doping profile
A Nandi, AK Saxena, S Dasgupta
IEEE Transactions on Electron Devices 60 (11), 3705-3709, 2013
642013
Asymmetric dual-spacer trigate FinFET device-circuit codesign and its variability analysis
PK Pal, BK Kaushik, S Dasgupta
IEEE Transactions on Electron Devices 62 (4), 1105-1112, 2015
582015
FPGA: An efficient and promising platform for real-time image processing applications
S Mittal, S Gupta, S Dasgupta
National Conference On Research and Development In Hardware Systems (CSI-RDHS), 2008
562008
Analytical modeling for the estimation of leakage current and subthreshold swing factor of nanoscale double gate FinFET device
B Raj, AK Saxena, S Dasgupta
Microelectronics international 26 (1), 53-63, 2009
542009
Two dimensional analytical modeling for asymmetric 3T and 4T double gate tunnel FET in sub-threshold region: Potential and electric field
M Yadav, A Bulusu, S Dasgupta
Microelectronics Journal 44 (12), 1251-1259, 2013
532013
System generator: The state-of-art FPGA design tool for dsp applications
S Mittal, S Gupta, S Dasgupta
Third International Innovative Conference On Embedded Systems, Mobile …, 2008
392008
Impact of dual-k spacer on analog performance of underlap FinFET
A Nandi, AK Saxena, S Dasgupta
Microelectronics Journal 43 (11), 883-887, 2012
382012
Analytical modeling of subthreshold current and subthreshold swing of an underlap DGMOSFET with tied–independent gate and symmetric–asymmetric options
R Vaddi, RP Agarwal, S Dasgupta
Microelectronics journal 42 (5), 798-807, 2011
372011
A degradation model of double gate and gate-all-around MOSFETs with interface trapped charges including effects of channel mobile charge carriers
R Shankar, G Kaushal, S Maheshwaram, S Dasgupta, SK Manhas
IEEE Transactions on Device and Materials Reliability 14 (2), 689-697, 2014
342014
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