| BSIM-HV: High Voltage MOSFET Model Including Quasi-Saturation and Self-Heating Effect H Agarwal, C Gupta, R Goel, P Kushwaha, YK Lin, MY Kao, JP Duarte, ... IEEE Transactions on Electron Devices, 2019 | 25 | 2019 |
| Analytical Modeling and Experimental Validation of Threshold Voltage in BSIM6 MOSFET Model H Agarwal, C Gupta, P Kushwaha, C Yadav, JP Duarte, S Khandelwal, ... IEEE Journal of the Electron Devices Society 3 (3), 2015 | 24 | 2015 |
| Anomalous Transconductance in Long Channel Halo Implanted MOSFETs: Analysis and Modeling H Agarwal, C Gupta, S Dey, C Hu, YS Chauhan IEEE Transactions on Electron Devices 64 (2), 2017 | 18 | 2017 |
| Accurate and Computationally Efficient Modeling of Nonquasi Static Effects in MOSFETs for Millimeter Wave Applications C Gupta, N Mohamed, H Agarwal, R Goel, C Hu, YS Chauhan IEEE Transactions on Electron Devices 66 (1), 2019 | 13 | 2019 |
| Analysis and Modeling of Temperature and Bias Dependence of Current Mismatch in Halo Implanted MOSFETs C Gupta, S Dey, H Agarwal, R Goel, C Hu, YS Chauhan IEEE Transactions on Electron Devices 65 (9), 2018 | 13 | 2018 |
| Analysis and Modeling of Zero-VTH Native Devices with Industry Standard BSIM6 Model C Gupta, H Agarwal, YK Lin, A Ito, C Hu, YS Chauhan Japanese Journal of Applied Physics 56 (4S), 2017 | 10 | 2017 |
| BSIM-BULK: Accurate Compact Model for Analog and RF Circuit Design C Gupta, R Goel, H Agarwal, C Hu, YS Chauhan IEEE Custom Integrated Circuits Conference (CICC), 2019 | 8 | 2019 |
| Analysis and Modeling of Capacitances in Halo-Implanted MOSFETs C Gupta, H Agarwal, S Dey, C Hu, YS Chauhan IEEE Electron Devices Technology and Manufacturing Conference (EDTM), 2017 | 8 | 2017 |
| Analysis and Modeling of Flicker Noise in Lateral Asymmetric Channel MOSFETs H Agarwal, P Kushwaha, C Gupta, S Khandelwal, C Hu, YS Chauhan Solid State Electronics 115, 2016 | 8 | 2016 |
| Improved Modeling of Bulk Charge Effect for BSIM-BULK Model C Gupta, H Agarwal, R Goel, C Hu, YS Chauhan IEEE Transactions on Electron Devices, 2019 | 7 | 2019 |
| Modeling of Current Mismatch and 1/f Noise for Halo-Implanted Drain-Extended MOSFETs C Gupta, S Dey, R Goel, C Hu, YS Chauhan IEEE Transactions on Electron Devices 67 (11), 4794-4801, 2020 | 5 | 2020 |
| Compact modeling of nonquasi-static effect in bulk MOSFETs for RF circuit design in sub-THz regime N Mohamed, H Agarwal, C Gupta, YS Chauhan 2016 3rd International Conference on Emerging Electronics (ICEE), 1-4, 2016 | 5 | 2016 |
| Modeling of High Voltage LDMOSFET using Industry Standard BSIM6 MOS Model C Gupta, H Agarwal, R Gillon, S Khandelwal, YK Lin, C Hu, YS Chauhan IEEE Conference on Electron Devices and Solid-State Circuits (EDSSC), 2016 | 5 | 2016 |
| Analysis and Compact Modeling of Thermal Noise in Halo Implanted MOSFETs R Goel, C Gupta, YS Chauhan 2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-4, 2020 | 3 | 2020 |
| Analysis and Modeling of Current Mismatch in Laterally Non-Uniform MOSFETs C Gupta, R Goel, YS Chauhan IEEE Transactions on Electron Devices 65 (10), 2018 | 3 | 2018 |
| Modeling of Body-bias Dependence of Overlap Capacitances in Bulk MOSFETs A Dasgupta, C Gupta, A Dutta, YK Lin, S Srihari, T Ethirajan, C Hu, ... IEEE International Conference on VLSI Design, 2017 | 2 | 2017 |
| Analysis and Modeling of Low Frequency Noise in Presence of Doping Non-Uniformity in MOSFETs H Agarwal, C Gupta, S Khandelwal, C Hu, S Dey, K Chan, YS Chauhan IEEE International Conference on Emerging Electronics (ICEE), 2016 | 2 | 2016 |
| Analysis and Modeling of Zero-VTH Devices with Industry Standard BSIM6 Model C Gupta, H Agarwal, YK Lin, S Khandelwal, A Ito, C Hu, YS Chauhan International Conference on Solid State Devices and Materials (SSDM2016), 2016 | 2 | 2016 |
| Analysis and Modeling of Anomalous Flicker Noise in Long Channel Halo MOSFETs R Goel, C Gupta, M Skalsky, YS Chauhan Solid-State Electronics, 108028, 2021 | 1 | 2021 |
| An Empirical Model to Enhance the Flexibility of gm/Id Tuning in BSIM-BULK Model R Goel, C Gupta, YS Chauhan IEEE Uttar Pradesh Section International Conference on Electrical …, 2018 | 1 | 2018 |
Yogesh S. ChauhanFellow IEEE, FNAE, Professor-IIT KanpurVerified email at iitk.ac.in
