| Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ... PLDI: Acm Sigplan Notices 49 (6), 259-269, 2014 | 2326 | 2014 |
| Androzoo: Collecting millions of android apps for the research community K Allix, TF Bissyandé, J Klein, Y Le Traon MSR: 2016 IEEE/ACM 13th Working Conference on Mining Software Repositories …, 2016 | 724 | 2016 |
| Iccta: Detecting inter-component privacy leaks in android apps L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ... ICSE: Proceedings of the 37th International Conference on Software …, 2015 | 704 | 2015 |
| Effective inter-component communication mapping in Android with Epicc: an essential step towards holistic security analysis D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon Usenix Security: Presented as part of the 22nd {USENIX} Security Symposium …, 2013 | 550 | 2013 |
| Static analysis of android apps: A systematic literature review L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ... IST: Information and Software Technology 88, 67-95, 2017 | 333 | 2017 |
| Dexpler: converting android dalvik bytecode to jimple for static analysis with soot A Bartel, J Klein, Y Le Traon, M Monperrus Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012 | 304 | 2012 |
| Automated and scalable t-wise test case generation strategies for software product lines G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon ICST: Software Testing, Verification and Validation (ICST), 2010 Third …, 2010 | 302 | 2010 |
| Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon TSE: IEEE Transactions on Software Engineering 40 (7), 650-670, 2014 | 222 | 2014 |
| Aspect-oriented multi-view modeling J Kienzle, W Al Abed, J Klein AOSD: Proceedings of the 8th ACM international conference on Aspect-oriented …, 2009 | 194 | 2009 |
| Automatically securing permission-based software by reducing the attack surface: An application to android A Bartel, J Klein, Y Le Traon, M Monperrus ASE: Proceedings of the 27th IEEE/ACM International Conference on Automated …, 2012 | 191 | 2012 |
| Pairwise testing for software product lines: comparison of two approaches G Perrouin, S Oster, S Sen, J Klein, B Baudry, Y Le Traon SQJ: Software Quality Journal 20 (3-4), 605-643, 2012 | 187 | 2012 |
| Got issues? who cares about it? a large scale investigation of issue trackers from github TF Bissyandé, D Lo, L Jiang, L Réveillere, J Klein, Y Le Traon ISSRE: 2013 IEEE 24th international symposium on software reliability …, 2013 | 179 | 2013 |
| Understanding android app piggybacking: A systematic study of malicious code grafting L Li, D Li, TF Bissyandé, J Klein, Y Le Traon, D Lo, L Cavallaro TIFS: IEEE Transactions on Information Forensics and Security 12 (6), 1269-1284, 2017 | 177 | 2017 |
| Droidra: Taming reflection to support whole-program analysis of android apps L Li, TF Bissyandé, D Octeau, J Klein ISSTA: Proceedings of the 25th International Symposium on Software Testing …, 2016 | 163 | 2016 |
| Semantic-based weaving of scenarios J Klein, L Hélouët, JM Jézéquel AOSD: Proceedings of the 5th international conference on Aspect-oriented …, 2006 | 152 | 2006 |
| Automated testing of android apps: A systematic literature review P Kong, L Li, J Gao, K Liu, TF Bissyandé, J Klein IEEE Transactions on Reliability 68 (1), 45-66, 2018 | 147 | 2018 |
| An investigation into the use of common libraries in android apps L Li, TF Bissyandé, J Klein, Y Le Traon SANER: 2016 IEEE 23rd International Conference on Software Analysis …, 2016 | 146 | 2016 |
| Empirical assessment of machine learning-based malware detectors for Android K Allix, TF Bissyandé, Q Jérome, J Klein, Y Le Traon EMSE: Empirical Software Engineering 21 (1), 183-211, 2016 | 141 | 2016 |
| Fixminer: Mining relevant fix patterns for automated program repair A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon EMSE: Empirical Software Engineering, 1-45, 2020 | 139 | 2020 |
| Multi-objective test generation for software product lines C Henard, M Papadakis, G Perrouin, J Klein, YL Traon SPLC: Proceedings of the 17th International Software Product Line Conference …, 2013 | 139 | 2013 |
Yves Le TraonProfessor of Computer Science, University of LuxembourgVerified email at uni.lu
