Jacques Klein
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Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps
S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ...
PLDI: Acm Sigplan Notices 49 (6), 259-269, 2014
Androzoo: Collecting millions of android apps for the research community
K Allix, TF Bissyandé, J Klein, Y Le Traon
MSR: 2016 IEEE/ACM 13th Working Conference on Mining Software Repositories …, 2016
Iccta: Detecting inter-component privacy leaks in android apps
L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ...
ICSE: Proceedings of the 37th International Conference on Software …, 2015
Effective inter-component communication mapping in Android with Epicc: an essential step towards holistic security analysis
D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon
Usenix Security: Presented as part of the 22nd {USENIX} Security Symposium …, 2013
Static analysis of android apps: A systematic literature review
L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ...
IST: Information and Software Technology 88, 67-95, 2017
Dexpler: converting android dalvik bytecode to jimple for static analysis with soot
A Bartel, J Klein, Y Le Traon, M Monperrus
Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012
Automated and scalable t-wise test case generation strategies for software product lines
G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon
ICST: Software Testing, Verification and Validation (ICST), 2010 Third …, 2010
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
TSE: IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
Automated testing of android apps: A systematic literature review
P Kong, L Li, J Gao, K Liu, TF Bissyandé, J Klein
IEEE Transactions on Reliability 68 (1), 45-66, 2018
Fixminer: Mining relevant fix patterns for automated program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon
EMSE: Empirical Software Engineering, 1-45, 2020
Got issues? who cares about it? a large scale investigation of issue trackers from github
TF Bissyandé, D Lo, L Jiang, L Réveillere, J Klein, Y Le Traon
ISSRE: 2013 IEEE 24th international symposium on software reliability …, 2013
Understanding android app piggybacking: A systematic study of malicious code grafting
L Li, D Li, TF Bissyandé, J Klein, Y Le Traon, D Lo, L Cavallaro
TIFS: IEEE Transactions on Information Forensics and Security 12 (6), 1269-1284, 2017
Automatically securing permission-based software by reducing the attack surface: An application to android
A Bartel, J Klein, Y Le Traon, M Monperrus
ASE: Proceedings of the 27th IEEE/ACM International Conference on Automated …, 2012
Pairwise testing for software product lines: comparison of two approaches
G Perrouin, S Oster, S Sen, J Klein, B Baudry, Y Le Traon
SQJ: Software Quality Journal 20 (3-4), 605-643, 2012
Is ChatGPT the ultimate programming assistant--how far is it?
H Tian, W Lu, TO Li, X Tang, SC Cheung, J Klein, TF Bissyandé
arXiv preprint arXiv:2304.11938, 2023
Aspect-oriented multi-view modeling
J Kienzle, W Al Abed, J Klein
AOSD: Proceedings of the 8th ACM international conference on Aspect-oriented …, 2009
Droidra: Taming reflection to support whole-program analysis of android apps
L Li, TF Bissyandé, D Octeau, J Klein
ISSTA: Proceedings of the 25th International Symposium on Software Testing …, 2016
Empirical assessment of machine learning-based malware detectors for Android
K Allix, TF Bissyandé, Q Jérome, J Klein, Y Le Traon
EMSE: Empirical Software Engineering 21 (1), 183-211, 2016
F a C o Y: a code-to-code search engine
K Kim, D Kim, TF Bissyandé, E Choi, L Li, J Klein, YL Traon
ICSE: Proceedings of the 40th International Conference on Software …, 2018
You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems
K Liu, A Koyuncu, TF Bissyandé, D Kim, J Klein, Y Le Traon
ICST: 2019 12th IEEE Conference on Software Testing, Validation and …, 2019
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