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Anatoli Kniazkov
Anatoli Kniazkov
Санкт-Петербургский политехнический университет Петра Великого
Verified email at rphf.spbstu.ru
Title
Cited by
Cited by
Year
Reflective method of electro-optic coefficients estimation
AV Kniazkov
Applied Physics B 118, 231-234, 2015
112015
Reflective polarization-modulation method of stress estimation using stress-induced birefringence
AV Kniazkov
Journal of Applied Physics 122 (12), 2017
42017
Estimation of electrooptic coefficients of LiNbO3 and Sr x Ba(1 − x)Nb2O6 crystals by modulation of light reflection coefficient
AV Kniazkov
Optics and Spectroscopy 118, 255-258, 2015
42015
An electric field sensor based on reflected light intensity modulation from electro-optical media
AV Kniazkov, SN Davydov
Optical Memory and Neural Networks 26, 145-149, 2017
32017
Electro-optic study of PZT ferroelectric ceramics using modulation of reflected light
AV Kniazkov
Technical Physics 61, 631-634, 2016
32016
Advanced holographic nondestructive testing system for residual stress analysis
A Kniazkov, YI Onischenko, GE Dovgalenko, GJ Salamo, ...
International Workshop on Nondestructive Testing and Computer Simulations in …, 1999
31999
Advanced holographic nondestructive testing system for residual stress analysis
A Kniazkov, YI Onischenko, GE Dovgalenko, GJ Salamo, ...
International Workshop on Nondestructive Testing and Computer Simulations in …, 1999
31999
Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines
Y Onishchenko, A Kniazkov, J Shulz, GJ Salamo
Nondestructive Evaluation of Utilities and Pipelines III 3588, 16-24, 1999
31999
Highly effective real time adaptive holographic interferometry and application to nondestructive testing in machinery
GE Dovgalenko, AV Kniazkov, YI Onischenko, GJ Salamo
A Critical Link: Diagnosis to Prognosis, 261-270, 1997
31997
Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) film
GE Dovgalenko, A Kniazkov, YI Onischenko, GJ Salamo
Laser Interferometry VIII: Applications 2861, 32-40, 1996
31996
Speckle-noise computing by two-parameter analysis of the reflected light’s periodic variations
TV Yakovleva, AV Kniazkov
Optical Memory and Neural Networks 23, 240-245, 2014
22014
Holographic instruments for residual stress measurement
G Salamo, G Dovgalenko, Y Onischenko, A Kniazkov
52 nd Meeting of the MFPT Society, 387-391, 1998
21998
Stress measurement of deposited SiO2 films on a silicon wafer using dimensional-stability holographic interferometry test
GE Dovgalenko, MS Haque, A Kniazkov, YI Onischenko, GJ Salamo, ...
Optical Manufacturing and Testing II 3134, 475-485, 1997
21997
The Study of the Surface Distribution of the Electrooptical Properties of the Medium by Reflected Light
AV Kniazkov
Optical Memory and Neural Networks 27, 191-195, 2018
12018
Measurement of the stress state of materials by reflection of polarization-modulated light
AV Kniazkov
Optics and Spectroscopy 122, 338-340, 2017
12017
Comparison of Two Techniques of Electro-optical Coefficient Evaluation
TV Yakovleva, AV Kniazkov
Physics Procedia 73, 189-192, 2015
12015
In-situ thin film stress measurement using high-stability portable holographic interferometer
GE Dovgalenko, MS Haque, A Kniazkov, YI Onischenko, GJ Salamo, ...
Optical Inspection and Micromeasurements 2782, 313-317, 1996
11996
Using electrostatic energy analyzer of a plane of symmetry for recording field emission spectra from carbon nanotube array
VB Bondarenko, SN Davydov, AV Kniazkov, AV Filimonov
Journal of Physics: Conference Series 1236 (1), 012007, 2019
2019
Reflective Method for Determining the Orientation of the Optical Axis of Uniaxial Crystals and Stressed Materials
A Kniazkov
2018 IEEE International Conference on Electrical Engineering and Photonics …, 2018
2018
Comparison of methods for determining the coherence of semiconductor laser light based on interference fringe contrast and speckle pattern morphology
AV Kniazkov, RI Harisov
Journal of Optical Technology 83 (5), 309-312, 2016
2016
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