Reflective method of electro-optic coefficients estimation AV Kniazkov Applied Physics B 118, 231-234, 2015 | 11 | 2015 |
Reflective polarization-modulation method of stress estimation using stress-induced birefringence AV Kniazkov Journal of Applied Physics 122 (12), 2017 | 4 | 2017 |
Estimation of electrooptic coefficients of LiNbO3 and Sr x Ba(1 − x)Nb2O6 crystals by modulation of light reflection coefficient AV Kniazkov Optics and Spectroscopy 118, 255-258, 2015 | 4 | 2015 |
An electric field sensor based on reflected light intensity modulation from electro-optical media AV Kniazkov, SN Davydov Optical Memory and Neural Networks 26, 145-149, 2017 | 3 | 2017 |
Electro-optic study of PZT ferroelectric ceramics using modulation of reflected light AV Kniazkov Technical Physics 61, 631-634, 2016 | 3 | 2016 |
Advanced holographic nondestructive testing system for residual stress analysis A Kniazkov, YI Onischenko, GE Dovgalenko, GJ Salamo, ... International Workshop on Nondestructive Testing and Computer Simulations in …, 1999 | 3 | 1999 |
Advanced holographic nondestructive testing system for residual stress analysis A Kniazkov, YI Onischenko, GE Dovgalenko, GJ Salamo, ... International Workshop on Nondestructive Testing and Computer Simulations in …, 1999 | 3 | 1999 |
Portable holographic interferometer for residual stress measurement and nondestructive testing (NDT) of pipelines Y Onishchenko, A Kniazkov, J Shulz, GJ Salamo Nondestructive Evaluation of Utilities and Pipelines III 3588, 16-24, 1999 | 3 | 1999 |
Highly effective real time adaptive holographic interferometry and application to nondestructive testing in machinery GE Dovgalenko, AV Kniazkov, YI Onischenko, GJ Salamo A Critical Link: Diagnosis to Prognosis, 261-270, 1997 | 3 | 1997 |
Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) film GE Dovgalenko, A Kniazkov, YI Onischenko, GJ Salamo Laser Interferometry VIII: Applications 2861, 32-40, 1996 | 3 | 1996 |
Speckle-noise computing by two-parameter analysis of the reflected light’s periodic variations TV Yakovleva, AV Kniazkov Optical Memory and Neural Networks 23, 240-245, 2014 | 2 | 2014 |
Holographic instruments for residual stress measurement G Salamo, G Dovgalenko, Y Onischenko, A Kniazkov 52 nd Meeting of the MFPT Society, 387-391, 1998 | 2 | 1998 |
Stress measurement of deposited SiO2 films on a silicon wafer using dimensional-stability holographic interferometry test GE Dovgalenko, MS Haque, A Kniazkov, YI Onischenko, GJ Salamo, ... Optical Manufacturing and Testing II 3134, 475-485, 1997 | 2 | 1997 |
The Study of the Surface Distribution of the Electrooptical Properties of the Medium by Reflected Light AV Kniazkov Optical Memory and Neural Networks 27, 191-195, 2018 | 1 | 2018 |
Measurement of the stress state of materials by reflection of polarization-modulated light AV Kniazkov Optics and Spectroscopy 122, 338-340, 2017 | 1 | 2017 |
Comparison of Two Techniques of Electro-optical Coefficient Evaluation TV Yakovleva, AV Kniazkov Physics Procedia 73, 189-192, 2015 | 1 | 2015 |
In-situ thin film stress measurement using high-stability portable holographic interferometer GE Dovgalenko, MS Haque, A Kniazkov, YI Onischenko, GJ Salamo, ... Optical Inspection and Micromeasurements 2782, 313-317, 1996 | 1 | 1996 |
Using electrostatic energy analyzer of a plane of symmetry for recording field emission spectra from carbon nanotube array VB Bondarenko, SN Davydov, AV Kniazkov, AV Filimonov Journal of Physics: Conference Series 1236 (1), 012007, 2019 | | 2019 |
Reflective Method for Determining the Orientation of the Optical Axis of Uniaxial Crystals and Stressed Materials A Kniazkov 2018 IEEE International Conference on Electrical Engineering and Photonics …, 2018 | | 2018 |
Comparison of methods for determining the coherence of semiconductor laser light based on interference fringe contrast and speckle pattern morphology AV Kniazkov, RI Harisov Journal of Optical Technology 83 (5), 309-312, 2016 | | 2016 |