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Co-authors
- Frédéric OverneyMETASVerified email at metas.ch
- Luca CallegaroINRIM - Istituto Nazionale di Ricerca MetrologicaVerified email at inrim.it
- Stephen RussekNISTVerified email at nist.gov
- Baumann HenriMetrology InstituteVerified email at metas.ch
- Jonathan M WilliamsNational Physical LaboratoryVerified email at npl.co.uk
- Philippe FlückigerDirector of Operations, EPFLVerified email at epfl.ch
- Michel CalameHead of Laboratory, Empa & Prof. of Nanoscience, University of BaselVerified email at empa.ch
- Kishan Thodkar2HS AGVerified email at one-graphene.com
- Christian SchoenenbergerDepartment of Physics and Swiss Nanoscience Institute of University of BaselVerified email at unibas.ch
- Hansjoerg SchererPhysikalisch-Technische BundesanstaltVerified email at ptb.de
- Clark HamiltonNISTVerified email at vmetrix.com
- Mark W. KellerPhysicist, National Institute of Standards and TechnologyVerified email at nist.gov
- Pierre GournayBureau International des Poids et MesuresVerified email at bipm.org
- Martina MarzanoResearcher, Istituto Nazionale di Ricerca Metrologica (INRiM), Torino, ItalyVerified email at inrim.it
- Stéphane SolveBIPMVerified email at bipm.org
- Martin ŠíraCzech Metrology InstituteVerified email at cmi.cz
- Felix Meliformer head of length, nano- and microtechnologyVerified email at metas.ch
- Rudolf ThalmannHead of sector, Federal Institute of Metrology METASVerified email at metas.ch
- Alain KüngSwiss Federal Institute of Metrology METASVerified email at metas.ch
- Nicolas WyrschEcole Polytechnique Fédérale de Lausanne (EPFL)Verified email at epfl.ch