Ion-enrichment and ion-depletion effect of nanochannel structures Q Pu, J Yun, H Temkin, S Liu Nano letters 4 (6), 1099-1103, 2004 | 635 | 2004 |
Ignition studies of energetic nanocomposites L Menon, S Patibandla, KB Ram, SI Shkuratov, D Aurongzeb, M Holtz, ... Applied physics letters 84 (23), 4735-4737, 2004 | 95 | 2004 |
Controlled growth of GaN nanowires by pulsed metalorganic chemical vapor deposition G Kipshidze, B Yavich, A Chandolu, J Yun, V Kuryatkov, I Ahmad, ... Applied Physics Letters 86 (3), 033104, 2005 | 93 | 2005 |
Thin-film thermal conductivity measurement using microelectrothermal test structures and finite-element-model-based data analysis N Stojanovic, J Yun, EBK Washington, JM Berg, MW Holtz, H Temkin Journal of microelectromechanical systems 16 (5), 1269-1275, 2007 | 86 | 2007 |
Evolution of surface roughness of AlN and GaN induced by inductively coupled plasma etching K Zhu, V Kuryatkov, B Borisov, J Yun, G Kipshidze, SA Nikishin, H Temkin, ... Journal of applied physics 95 (9), 4635-4641, 2004 | 67 | 2004 |
Plasma etching transfer of a nanoporous pattern on a generic substrate L Menon, KB Ram, S Patibandla, D Aurongzeb, M Holtz, J Yun, ... Journal of The Electrochemical Society 151 (7), C492, 2004 | 30 | 2004 |
Semiconductor structure including a ferroelectric transistor and method for the formation thereof R Van Bentum, J Yun, SEO Seunghwan, J Schmid US Patent 9,293,556, 2016 | 28 | 2016 |
Semiconductor memory device and method of operating the same KW Kim, JS Yun US Patent 7,978,559, 2011 | 22 | 2011 |
Influence of nanocrystal growth kinetics on interface roughness in nickel–aluminum multilayers D Aurongzeb, M Holtz, M Daugherty, JM Berg, A Chandolu, J Yun, ... Applied physics letters 83 (26), 5437-5439, 2003 | 19 | 2003 |
Low-resistance Ohmic contacts to digital alloys of n-AlGaN/AlN J Yun, K Choi, K Mathur, V Kuryatkov, B Borisov, G Kipshidze, S Nikishin, ... IEEE electron device letters 27 (1), 22-24, 2005 | 18 | 2005 |
Low-variation SRAM bitcells in 22nm FDSOI technology V Joshi, H Ramamurthy, S Balasubramanian, S Seo, H Yoon, X Zou, ... 2017 Symposium on VLSI Technology, T222-T223, 2017 | 15 | 2017 |
Semiconductor memory device and method of operating the same KW Kim, JS Yun US Patent 7,978,554, 2011 | 15 | 2011 |
MBIST-supported Trim Adjustment to Compensate Thermal Behavior of MRAM C Münch, J Yun, M Keim, MB Tahoori 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 8 | 2021 |
MBIST Support for Reliable eMRAM Sensing J Yun, B Nadeau-Dostie, M Keim, C Dray, M Boujamaa 2020 IEEE European Test Symposium (ETS), 1-6, 2020 | 8 | 2020 |
Semiconductor structure including a ferroelectric transistor and method for the formation thereof R Van Bentum, J Yun, SEO Seunghwan, J Schmid US Patent 9,536,992, 2017 | 8 | 2017 |
Method and apparatus for bit-line sensing gates on an SRAM cell SEO Seunghwan, J Yun US Patent 9,224,455, 2015 | 8 | 2015 |
MBIST Supported Multi Step Trim for Reliable eMRAM Sensing J Yun, B Nadeau-Dostie, M Keim, L Schramm, C Dray, M Boujamaa, ... 2020 IEEE International Test Conference (ITC), 1-5, 2020 | 6 | 2020 |
Micro-Raman Scattering From Hexagonal GaN, AlN, and AlxGa1−x}N Grown on (111) Oriented Silicon: Stress Mapping of Cracks C Ramkumar, T Prokofyeva, M Seon, M Holtz, K Choi, J Yun, SA Nikishin, ... MRS Online Proceedings Library 693, 39-43, 2001 | 6 | 2001 |
Smart Hammering: A practical method of pinhole detection in MRAM memories SB Mamaghani, C Münch, J Yun, M Keim, MB Tahoori 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023 | 4 | 2023 |
Preparation of optoelectronic devices based on AlN/AlGaN superlattices M Holtz, G Kipshidze, A Chandolu, J Yun, B Borisov, V Kuryatkov, K Zhu, ... MRS Online Proceedings Library (OPL) 744, 2002 | 4 | 2002 |