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giulia MARCELLO
giulia MARCELLO
Failure Analysis Engineer, ST Microelectronics
Verified email at st.com
Title
Cited by
Cited by
Year
The role of the optical trans-characteristics in laser diode analysis
G Mura, M Vanzi, G Marcello, R Cao
Microelectronics Reliability 53 (9-11), 1538-1542, 2013
132013
ESD tests on 850 nm GaAs-based VCSELs
M Vanzi, G Mura, G Marcello, K Xiao
Microelectronics Reliability 64, 617-622, 2016
102016
Practical optical gain by an extended Hakki-Paoli method
M Vanzi, G Marcello, G Mura, G Le Gales, S Joly, Y Deshayes, L Bechou
Microelectronics Reliability 76, 579-583, 2017
62017
Extended modal gain measurement in DFB laser diodes
M Vanzi, G Marcello, G Mura, G Le Galès, S Joly, Y Deshayes, L Bechou
IEEE Photonics Technology Letters 29 (2), 197-200, 2017
62017
Proton irradiation effects on commercial laser diodes
G Marcello, G Mura, M Vanzi, M Bagatin, S Gerardin, A Paccagnella
2015 15th European Conference on Radiation and Its Effects on Components and …, 2015
62015
FIB-induced electro-optical alterations in a DFB InP laser diode
G Mura, M Vanzi, G Marcello
Microelectronics Reliability 54 (9-10), 2151-2153, 2014
52014
LVI-based failure analysis after PRBS defect activation: Two cases study
G Marcello, A Merassi, M Medda
Microelectronics Reliability 100, 113387, 2019
32019
Side-Mode Excitation in Single-Mode Laser Diodes
M Vanzi, K Xiao, G Marcello, G Mura
IEEE Transactions on Device and Materials Reliability 16 (2), 158-163, 2016
32016
Clamp voltage and ideality factor in laser diodes
M Vanzi, G Mura, G Marcello, G Martines
Microelectronics Reliability 55 (9-10), 1736-1740, 2015
32015
Complex automotive ICs defect localization driven by quiescent power supply current: Three cases study
G Marcello, E Meda, M Medda
Microelectronics Reliability 88, 294-298, 2018
22018
Seed laser diodes in pulsed operation: limitations and reliability investigations
G Le Gales, M Giulia, S Joly, G Pedroza, A Morisset, F Laruelle, L Bechou
Optique Bordeaux, 2016
12016
Seed laser diodes in pulsed operation: limitations and reliability
G Le Galès, S Joly, G Marcello, G Pedroza, A Morisset, F Laruelle, ...
Physics and Simulation of Optoelectronic Devices XXV 10098, 100980S, 2017
2017
An extended model for optical gain calculations in single-mode Laser diodes, International Symposium on Reliability of Optoelectronics for Systems
M Vanzi, M Giulia, G Mura, G Le Gales, S Joly, Y Deshayes, L Bechou
ISROS 2016, 2016
2016
1060nm seed laser diodes in pulsed operation: performances and safe operating area
G Le Gales, M Giulia, S Joly, G Pedroza, A Morisset, F Laruelle, L Bechou
ISROS 2016, 2016
2016
Ideality factor and threshold voltage in laser diodes
M Vanzi, G Mura, G Marcello
2014 Third Mediterranean Photonics Conference, 1-3, 2014
2014
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