| Separation of interactions by noncontact force microscopy M Guggisberg, M Bammerlin, C Loppacher, O Pfeiffer, A Abdurixit, ... Physical review B 61 (16), 11151, 2000 | 307 | 2000 |
| Atomically resolved edges and kinks of NaCl islands on Cu (111): Experiment and theory R Bennewitz, AS Foster, LN Kantorovich, M Bammerlin, C Loppacher, ... Physical Review B 62 (3), 2074, 2000 | 266 | 2000 |
| Direct determination of the energy required to operate a single molecule switch C Loppacher, M Guggisberg, O Pfeiffer, E Meyer, M Bammerlin, R Lüthi, ... Physical review letters 90 (6), 066107, 2003 | 222 | 2003 |
| True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy M Bammerlin Probe Micros. 1, 3-9, 1997 | 217 | 1997 |
| Atomic-scale stick-slip processes on Cu (111) R Bennewitz, T Gyalog, M Guggisberg, M Bammerlin, E Meyer, ... Physical Review B 60 (16), R11301, 1999 | 155 | 1999 |
| Experimental aspects of dissipation force microscopy C Loppacher, R Bennewitz, O Pfeiffer, M Guggisberg, M Bammerlin, ... Physical Review B 62 (20), 13674, 2000 | 154 | 2000 |
| Ultrathin films of NaCl on Cu (111): a LEED and dynamic force microscopy study R Bennewitz, V Barwich, M Bammerlin, C Loppacher, M Guggisberg, ... Surface Science 438 (1-3), 289-296, 1999 | 149 | 1999 |
| Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current C Loppacher, M Bammerlin, M Guggisberg, S Schär, R Bennewitz, ... Physical Review B 62 (24), 16944, 2000 | 138 | 2000 |
| Site‐specific friction force spectroscopy E Meyer, R Lüthi, L Howald, M Bammerlin, M Guggisberg, HJ Güntherodt Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996 | 131 | 1996 |
| Dynamic SFM with true atomic resolution on alkali halide surfaces M Bammerlin, R Lüthi, E Meyer, A Baratoff, J Lü, M Guggisberg, ... Applied Physics A 66, S293-S294, 1998 | 118 | 1998 |
| Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers C Loppacher, M Bammerlin, F Battiston, M Guggisberg, D Müller, ... Applied Physics A 66, S215-S218, 1998 | 107 | 1998 |
| Nanotribology: an UHV-SFM study on thin films of C60 and AgBr R Lüthi, E Meyer, H Haefke, L Howald, W Gutmannsbauer, M Guggisberg, ... Surface science 338 (1-3), 247-260, 1995 | 102 | 1995 |
| Aspects of dynamic force microscopy on NaCl/Cu (111): resolution, tip–sample interactions and cantilever oscillation characteristics R Bennewitz, M Bammerlin, M Guggisberg, C Loppacher, A Baratoff, ... Surface and interface analysis 27 (5‐6), 462-466, 1999 | 79 | 1999 |
| Aspects of dynamic force microscopy on NaCl/Cu (111): resolution, tip–sample interactions and cantilever oscillation characteristics R Bennewitz, M Bammerlin, M Guggisberg, C Loppacher, A Baratoff, ... Surface and interface analysis 27 (5‐6), 462-466, 1999 | 79 | 1999 |
| Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques C Loppacher, M Bammerlin, M Guggisberg, F Battiston, R Bennewitz, ... Applied surface science 140 (3-4), 287-292, 1999 | 79 | 1999 |
| Carbon nanotubes as tips in non-contact SFM V Barwich, M Bammerlin, A Baratoff, R Bennewitz, M Guggisberg, ... Applied surface science 157 (4), 269-273, 2000 | 52 | 2000 |
| Dynamic force microscopy across steps on the Si (111)-(7× 7) surface M Guggisberg, M Bammerlin, A Baratoff, R Lüthi, C Loppacher, ... Surface science 461 (1-3), 255-265, 2000 | 51 | 2000 |
| Using higher flexural modes in non-contact force microscopy O Pfeiffer, C Loppacher, C Wattinger, M Bammerlin, U Gysin, ... Applied surface science 157 (4), 337-342, 2000 | 48 | 2000 |
| Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy LM Eng, M Bammerlin, C Loppacher, M Guggisberg, R Bennewitz, R Lüthi, ... Applied surface science 140 (3-4), 253-258, 1999 | 46 | 1999 |
| Comparison of dynamic lever STM and noncontact AFM. M Guggisberg, M Bammerlin, R Lüthi, C Loppacher, F Battiston, J Lü, ... Applied Physics A: Materials Science & Processing 66 (7), 1998 | 36 | 1998 |
Meyer ErnstUniversity of BaselBestätigte E-Mail-Adresse bei unibas.ch
