Martin Guggisberg
Martin Guggisberg
PH FHNW / Universität Basel
Bestätigte E-Mail-Adresse bei fhnw.ch
Titel
Zitiert von
Zitiert von
Jahr
Separation of interactions by noncontact force microscopy
M Guggisberg, M Bammerlin, C Loppacher, O Pfeiffer, A Abdurixit, ...
Physical Review B 61 (16), 11151, 2000
2802000
Atomically resolved edges and kinks of NaCl islands on Cu (111): Experiment and theory
R Bennewitz, AS Foster, LN Kantorovich, M Bammerlin, C Loppacher, ...
Physical Review B 62 (3), 2074, 2000
2472000
True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy
M Bammerlin
Probe Micros. 1, 3-9, 1997
2081997
Direct determination of the energy required to operate a single molecule switch
C Loppacher, M Guggisberg, O Pfeiffer, E Meyer, M Bammerlin, R Lüthi, ...
Physical review letters 90 (6), 066107, 2003
2072003
Experimental aspects of dissipation force microscopy
C Loppacher, R Bennewitz, O Pfeiffer, M Guggisberg, M Bammerlin, ...
Physical Review B 62 (20), 13674, 2000
1442000
Atomic-scale stick-slip processes on Cu (111)
R Bennewitz, T Gyalog, M Guggisberg, M Bammerlin, E Meyer, ...
Physical Review B 60 (16), R11301, 1999
1331999
Ultrathin films of NaCl on Cu (111): a LEED and dynamic force microscopy study
R Bennewitz, V Barwich, M Bammerlin, C Loppacher, M Guggisberg, ...
Surface Science 438 (1-3), 289-296, 1999
1311999
Dynamic force microscopy of copper surfaces: Atomic resolution and distance dependence of tip-sample interaction and tunneling current
C Loppacher, M Bammerlin, M Guggisberg, S Schär, R Bennewitz, ...
Physical Review B 62 (24), 16944, 2000
1272000
Site‐specific friction force spectroscopy
E Meyer, R Lüthi, L Howald, M Bammerlin, M Guggisberg, HJ Güntherodt
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
1181996
Dynamic SFM with true atomic resolution on alkali halide surfaces
M Bammerlin, R Lüthi, E Meyer, A Baratoff, J Lü, M Guggisberg, ...
Applied Physics A 66 (1), S293-S294, 1998
1131998
Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers
C Loppacher, M Bammerlin, F Battiston, M Guggisberg, D Müller, ...
Applied Physics A 66 (1), S215-S218, 1998
1051998
Nanotribology: an UHV-SFM study on thin films of C60 and AgBr
R Lüthi, E Meyer, H Haefke, L Howald, W Gutmannsbauer, M Guggisberg, ...
Surface science 338 (1-3), 247-260, 1995
901995
Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques
C Loppacher, M Bammerlin, M Guggisberg, F Battiston, R Bennewitz, ...
Applied surface science 140 (3-4), 287-292, 1999
751999
Aspects of dynamic force microscopy on NaCl/Cu (111): resolution, tip–sample interactions and cantilever oscillation characteristics
R Bennewitz, M Bammerlin, M Guggisberg, C Loppacher, A Baratoff, ...
Surface and interface analysis 27 (5‐6), 462-466, 1999
731999
Aspects of dynamic force microscopy on NaCl/Cu (111): resolution, tip–sample interactions and cantilever oscillation characteristics
R Bennewitz, M Bammerlin, M Guggisberg, C Loppacher, A Baratoff, ...
Surface and interface analysis 27 (5‐6), 462-466, 1999
731999
Dynamic force microscopy across steps on the Si (111)-(7× 7) surface
M Guggisberg, M Bammerlin, A Baratoff, R Lüthi, C Loppacher, ...
Surface Science 461 (1-3), 255-265, 2000
512000
Carbon nanotubes as tips in non-contact SFM
V Barwich, M Bammerlin, A Baratoff, R Bennewitz, M Guggisberg, ...
Applied surface science 157 (4), 269-273, 2000
482000
Using higher flexural modes in non-contact force microscopy
O Pfeiffer, C Loppacher, C Wattinger, M Bammerlin, U Gysin, ...
Applied surface science 157 (4), 337-342, 2000
452000
Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy
LM Eng, M Bammerlin, C Loppacher, M Guggisberg, R Bennewitz, R Lüthi, ...
Applied surface science 140 (3-4), 253-258, 1999
421999
Comparison of dynamic lever STM and noncontact AFM.
M Guggisberg, M Bammerlin, R Lüthi, C Loppacher, F Battiston, J Lü, ...
Applied Physics A: Materials Science & Processing 66 (7), 1998
351998
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