Follow
Saikiran Marampally
Saikiran Marampally
PhD, Iowa State University; Analog Design Engineer, Texas Instruments Inc.
Verified email at iastate.edu
Title
Cited by
Cited by
Year
Spacer engineering-based high-performance reconfigurable FET with low off current characteristics
A Bhattacharjee, M Saikiran, A Dutta, B Anand, S Dasgupta
IEEE Electron Device Letters 36 (5), 520-522, 2015
322015
A first insight to the thermal dependence of the DC, analog and RF performance of an S/D spacer engineered DG-ambipolar FET
A Bhattacharjee, M Saikiran, S Dasgupta
IEEE Transactions on Electron Devices 64 (10), 4327-4334, 2017
182017
Robust DfT techniques for built-in fault detection in operational amplifiers with high coverage
M Saikiran, M Ganji, D Chen
2020 IEEE International Test Conference (ITC), 1-10, 2020
152020
Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection
M Saikiran, M Ganji, D Chen
2022 IEEE International Symposium on Circuits and Systems (ISCAS), 1580-1584, 2022
122022
All digital low-cost built-in defect testing strategy for operational amplifiers with high coverage
M Sekyere, M Saikiran, D Chen
2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022
112022
All digital low-overhead sar adc built-in self-test for fault detection and diagnosis
M Ganji, M Saikiran, D Chen
2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022
112022
A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits
M Saikiran, M Ganji, D Chen
2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022
102022
Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators
M Saikiran, M Ganji, D Chen
2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022
92022
Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency
M Saikiran, M Sekyere, M Ganji, R Yang, D Chen
Analog Integrated Circuits and Signal Processing 117 (1), 73-94, 2023
62023
Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits
M Sekyere, S Marampally, D Chen
42023
Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency
M Saikiran, M Sekyere, M Ganji, D Chen
2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023
22023
Digital-Like Built-In Defect-Oriented Test for Analog-Mixed Signal Circuits
M GANJI, M Saikiran, K BHATHEJA, D CHEN
Authorea Preprints, 2023
12023
Systematic Methodology to Design High Precision Voltage References with Sub-ppm/° C Temperature Coefficient
V Naganadhan, M Saikiran, M Gshash, D Chen
2023 IEEE East-West Design & Test Symposium (EWDTS), 1-11, 2023
12023
Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview
M Saikiran, M Sekyere, M Ganji, D Chen
2023 IEEE East-West Design & Test Symposium (EWDTS), 1-5, 2023
12023
A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers
M Sekyere, M Saikiran, D Chen
2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023
12023
A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models
M Ganji, M Saikiran, D Chen
2022 IEEE International Symposium on Circuits and Systems (ISCAS), 605-609, 2022
12022
Techniques for efficient and robust defect detection in analog and mixed signal circuits
M Saikiran
Iowa State University : https://dr.lib.iastate.edu/entities/publication …, 2023
2023
Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency (preprint)
M Saikiran, M Sekyere, M Ganji, R Yang, D Chen
2022
An S/D spacer engineered DG ambipolar FET device for investigating the thermal dependence of the DC, Analog ad RF performance
B Abhishek, S Marampally, D Sudeb
AU Patent 2,021,107,091, 2021
2021
S/D Spacer Effects on the Performance of a Si Nanowire Ambipolar FET and its Optimization A.
SD A. Bhattacharjee, M.Saikiran
International Workshop on Physics of Semiconductor Devices, 2015
2015
The system can't perform the operation now. Try again later.
Articles 1–20