Spacer engineering-based high-performance reconfigurable FET with low off current characteristics A Bhattacharjee, M Saikiran, A Dutta, B Anand, S Dasgupta IEEE Electron Device Letters 36 (5), 520-522, 2015 | 32 | 2015 |
A first insight to the thermal dependence of the DC, analog and RF performance of an S/D spacer engineered DG-ambipolar FET A Bhattacharjee, M Saikiran, S Dasgupta IEEE Transactions on Electron Devices 64 (10), 4327-4334, 2017 | 18 | 2017 |
Robust DfT techniques for built-in fault detection in operational amplifiers with high coverage M Saikiran, M Ganji, D Chen 2020 IEEE International Test Conference (ITC), 1-10, 2020 | 15 | 2020 |
Robust Built-in Defect-Detection for Low Drop-Out Regulators using Digital Mismatch Injection M Saikiran, M Ganji, D Chen 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 1580-1584, 2022 | 12 | 2022 |
All digital low-cost built-in defect testing strategy for operational amplifiers with high coverage M Sekyere, M Saikiran, D Chen 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 11 | 2022 |
All digital low-overhead sar adc built-in self-test for fault detection and diagnosis M Ganji, M Saikiran, D Chen 2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022 | 11 | 2022 |
A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits M Saikiran, M Ganji, D Chen 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022 | 10 | 2022 |
Digital Defect-Oriented Test Methodology for Flipped Voltage Follower Low Dropout (LDO) Voltage Regulators M Saikiran, M Ganji, D Chen 2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems …, 2022 | 9 | 2022 |
Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency M Saikiran, M Sekyere, M Ganji, R Yang, D Chen Analog Integrated Circuits and Signal Processing 117 (1), 73-94, 2023 | 6 | 2023 |
Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits M Sekyere, S Marampally, D Chen | 4 | 2023 |
Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency M Saikiran, M Sekyere, M Ganji, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023 | 2 | 2023 |
Digital-Like Built-In Defect-Oriented Test for Analog-Mixed Signal Circuits M GANJI, M Saikiran, K BHATHEJA, D CHEN Authorea Preprints, 2023 | 1 | 2023 |
Systematic Methodology to Design High Precision Voltage References with Sub-ppm/° C Temperature Coefficient V Naganadhan, M Saikiran, M Gshash, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-11, 2023 | 1 | 2023 |
Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview M Saikiran, M Sekyere, M Ganji, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-5, 2023 | 1 | 2023 |
A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers M Sekyere, M Saikiran, D Chen 2023 IEEE East-West Design & Test Symposium (EWDTS), 1-6, 2023 | 1 | 2023 |
A Wide-Range Low-cost Temperature to Digital Converter Independent of Device Models M Ganji, M Saikiran, D Chen 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 605-609, 2022 | 1 | 2022 |
Techniques for efficient and robust defect detection in analog and mixed signal circuits M Saikiran Iowa State University : https://dr.lib.iastate.edu/entities/publication …, 2023 | | 2023 |
Low-Cost Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Enhanced Time-Efficiency (preprint) M Saikiran, M Sekyere, M Ganji, R Yang, D Chen | | 2022 |
An S/D spacer engineered DG ambipolar FET device for investigating the thermal dependence of the DC, Analog ad RF performance B Abhishek, S Marampally, D Sudeb AU Patent 2,021,107,091, 2021 | | 2021 |
S/D Spacer Effects on the Performance of a Si Nanowire Ambipolar FET and its Optimization A. SD A. Bhattacharjee, M.Saikiran International Workshop on Physics of Semiconductor Devices, 2015 | | 2015 |