| Soft Error Mechanisms, Modeling and Mitigation S Sayil Springer, 2016 | 36 | 2016 |
| Single-event soft errors in CMOS logic S Sayil, J Wang IEEE Potentials 31 (2), 15-22, 2012 | 35 | 2012 |
| Single event crosstalk shielding for CMOS logic S Sayil, AB Akkur, N Gaspard III Microelectronics Journal 40 (6), 1000-1006, 2009 | 34 | 2009 |
| Comparison of contactless measurement and testing techniques to a all-silicon optical test and characterization method S Sayil, DV Kerns, SE Kerns IEEE Transactions on Instrumentation and Measurement 54 (5), 2082-2089, 2005 | 31 | 2005 |
| Soft Error Mitigation using Transmission Gate with varying Gate and Body Bias S Sayil, A Shah, M Zaman, M Islam IEEE Design and Test, 2017 | 28 | 2017 |
| Soft error and soft delay mitigation using dynamic threshold technique S Sayil, NB Patel IEEE Transactions on Nuclear Science 57 (6), 3553-3559, 2010 | 26 | 2010 |
| Modeling single event crosstalk in nanometer technologies S Sayil, VK Boorla, SR Yeddula IEEE Transactions on Nuclear Science 58 (5), 2493-2502, 2011 | 23 | 2011 |
| A survey of circuit-level soft error mitigation methodologies S Sayil Analog Integrated Circuits and Signal Processing 99 (1), 63-70, 2019 | 15 | 2019 |
| A hybrid maximum error algorithm with neighborhood training for CMAC S Sayil, KY Lee Proceedings of the 2002 International Joint Conference on Neural Networks …, 2002 | 15 | 2002 |
| All-silicon optical contactless testing of integrated circuits S Sayil, D Kerns, S Kerns International journal of electronics 89 (7), 537-547, 2002 | 14 | 2002 |
| Precise estimation of crosstalk in multiline circuits S Sayil, M Rudrapati International journal of electronics 94 (4), 413-429, 2007 | 13 | 2007 |
| Mitigation for single event coupling delay S Sayil, AB Akkur International journal of electronics 97 (1), 17-29, 2010 | 12 | 2010 |
| Optical contactless probing: An all-silicon, fully optical approach S Sayil IEEE Design & Test of Computers 23 (2), 138-146, 2006 | 12 | 2006 |
| A survey contactless measurement and testing techniques S Sayil, DV Kerns, SE Kerns IEEE Potentials 24 (1), 25-28, 2005 | 12 | 2005 |
| Accurate prediction of crosstalk for RC interconnects S Sayil, M Rudrapati Turkish Journal of Electrical Engineering and Computer Sciences 17 (1), 55-67, 2009 | 10 | 2009 |
| Avalanche breakdown in silicon devices for contactless logic testing and optical interconnect S Sayil Analog Integrated Circuits and Signal Processing 56, 213-221, 2008 | 10 | 2008 |
| Modeling single event crosstalk speedup in nanometer technologies S Sayil, L Yuan Microelectronics Journal 46 (5), 343-350, 2015 | 7 | 2015 |
| Space Radiation Effects on Technology and Human Biology and Proper Mitigation Techniques S Sayil TSGC/NASA Educational Grant for Space Related Course, 2010 | 6 | 2010 |
| A multiline model for time-efficient estimation of crosstalk S Sayıl, UK Borra Analog Integrated Circuits and Signal Processing 59, 65-75, 2009 | 6 | 2009 |
| Mitigating the thermally induced single event crosstalk S Sayil, P Bhowmik Analog Integrated Circuits and Signal Processing 92, 247-253, 2017 | 5 | 2017 |
Abhishek AkkurVerified email at stanford.edu
