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Stephen Adamshick
Stephen Adamshick
Verified email at wne.edu
Title
Cited by
Cited by
Year
Feasibility of coaxial through silicon via 3D integration
S Adamshick, D Coolbaugh, M Liehr
Electronics letters 49 (16), 1028-1030, 2013
352013
Experimental characterization of coaxial through silicon vias for 3D integration
S Adamshick, D Coolbaugh, M Liehr
Microelectronics Journal 46 (5), 377-382, 2015
162015
High frequency electrical characterization of 3D signal/ground through silicon vias
S Adamshick, R Carroll, M Rao, D La Tuplie, S Kruger, J Burke, M Liehr
Progress In Electromagnetics Research Letters 47, 71-75, 2014
62014
Antenna on Chip Design Utilizing 3D Integration for Mixed Signal Applications
S Adamshick, A Johnson, K Moriarty, W Tremblay, J Burke
2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS), 2017
42017
A novel low loss 3D system-in-package approach for 60GHz antenna on chip applications
S Adamshick, SR Govindarajulu, EA Alwan
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
22020
Experimental characterisation of coaxial TSV transistor keep out zones
S Adamshick, S Northrup, M Liehr
Micro & Nano Letters 13 (10), 1457-1459, 2018
12018
Characterization of Rigid and Flexible 3D Printed Planar Antennas
T Searles, AD Johnson, M Musiak, J Burke, S Adamshick
2019 IEEE International Flexible Electronics Technology Conference (IFETC), 1-5, 2019
2019
Fabrication method for annular/shielded copper interconnects
S Adamshick, J Burke, M Liehr
Micro & Nano Letters 12 (5), 301-303, 2017
2017
3D integration with coaxial through silicon vias
S Adamshick
State University of New York at Albany, 2015
2015
Diffusion along triple junctions is this the pathway for narrow Cu conductor lines?
JR Lloyd, S Adamshick, C Durcan, Y Kandel, IN Lund, BT McGowan, ...
2012 IEEE International Integrated Reliability Workshop Final Report, 151-153, 2012
2012
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