| Wavelet decomposition based fault detection in cascaded H-bridge multilevel inverter using artificial neural network D Chowdhury, M Bhattacharya, D Khan, S Saha, A Dasgupta 2017 2nd IEEE International Conference on Recent Trends in Electronics …, 2017 | 25 | 2017 |
| Wavelet based component fault detection in diode clamped multilevel inverter using probabilistic neural network M Bhattacharya, S Saha, D Khan, T Nag 2017 2nd International Conference for Convergence in Technology (I2CT), 1163 …, 2017 | 12 | 2017 |
| Performance analysis and optimization of a SnSe-based thermoelectric generator M Bhattacharya, M Ranjan, N Kumar, T Maiti ACS Applied Energy Materials 4 (8), 8211-8219, 2021 | 7 | 2021 |
| Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs L Shi, S Zhu, J Qian, M Jin, M Bhattacharya, MH White, AK Agarwal, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2023 | 5 | 2023 |
| N-Type TiO2-Based Reusable Sensor for Photon-Assisted Cd(II) Ion Detection M Bhattacharya, S Dey, CK Ghosh IEEE Transactions on Electron Devices 68 (6), 2951-2956, 2021 | 4 | 2021 |
| Reliability Comparison of Commercial Planar and Trench 4H-SiC Power MOSFETs S Zhu, L Shi, M Jin, J Qian, M Bhattacharya, HLR Maddi, MH White, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2023 | 3 | 2023 |
| An Effective Screening Technique for Early Oxide Failure in SiC Power MOSFETs L Shi, J Qian, M Jin, M Bhattacharya, H Yu, MH White, AK Agarwal, ... 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA …, 2023 | 2 | 2023 |
| An Investigation of Body Diode Reliability in Commercial 1.2 kV SiC Power MOSFETs with Planar and Trench Structures J Qian, L Shi, M Jin, M Bhattacharya, A Shimbori, H Yu, S Houshmand, ... Micromachines 15 (2), 177, 2024 | 1 | 2024 |
| Pulse-Voltage Time-Dependent Dielectric Breakdown of Commercial 1.2 kV 4H-SiC Power MOSFETs M Jin, L Shi, J Qian, M Bhattacharya, H Yu, MH White, AK Agarwal, ... 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA …, 2023 | 1 | 2023 |
| The Effect of Cryogenic Temperature on Subthreshold Hysteresis of Commercial SiC Power MOSFETs M Bhattacharya, M Jin, J Qian, L Shi, H Yu, MH White, AK Agarwal 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA …, 2023 | 1 | 2023 |
| Trapped Exciton-Enhanced Response of n-TiO2(110)/p-Si(111) Nanostructures as Photodetectors M Bhattacharya, S Dey, MS Islam, A Roychowdhury, J Ghosh, CK Ghosh ACS Applied Nano Materials 5 (2), 2316-2325, 2022 | 1 | 2022 |
| Investigation on gate oxide reliability under gate bias screening for commercial SiC planar and trench MOSFETs L Shi, J Qian, M Jin, M Bhattacharya, H Yu, A Shimbori, MH White, ... Materials Science in Semiconductor Processing 174, 108194, 2024 | | 2024 |
| Modeling of Charge-to-Breakdown with an Electron Trapping Model for Analysis of Thermal Gate Oxide Failure Mechanism in SiC Power MOSFETs J Qian, L Shi, M Jin, M Bhattacharya, A Shimbori, H Yu, S Houshmand, ... Materials 17 (7), 1455, 2024 | | 2024 |
| Investigation of the Constant Current Stress for Charge-to-breakdown Extraction in Commercial SiC Power MOSFETs J Qian, L Shi, M Jin, M Bhattacharya, H Yu, MH White, AK Agarwal, ... 2023 IEEE 10th Workshop on Wide Bandgap Power Devices & Applications (WiPDA …, 2023 | | 2023 |
| SiC Trench MOSFET with Depletion-Mode pMOS for Enhanced Short-Circuit Capability and Switching Performance H Yu, L Shi, M Bhattacharya, M Jin, J Qian, AK Agarwal Electronics 12 (23), 4764, 2023 | | 2023 |
Anant AgarwalProfessor of Electrical Engineering, Ohio State UniversityVerified email at ieee.org
