Follow
Nima Aghaee
Nima Aghaee
Verified email at ericsson.com - Homepage
Title
Cited by
Cited by
Year
Temperature-aware SoC test scheduling considering inter-chip process variation
N Aghaee, Z He, Z Peng, P Eles
2010 19th IEEE Asian Test Symposium, 395-398, 2010
162010
An efficient temperature-gradient based burn-in technique for 3D stacked ICs
N Aghaee, Z Peng, P Eles
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
152014
Process-variation and temperature aware SoC test scheduling technique
N Aghaee, Z Peng, P Eles
Journal of electronic testing 29, 499-520, 2013
152013
Adaptive temperature-aware SoC test scheduling considering process variation
N Aghaee, Z Peng, P Eles
2011 14th Euromicro Conference on Digital System Design, 197-204, 2011
132011
Temperature-gradient-based burn-in and test scheduling for 3-D stacked ICs
N Aghaee, Z Peng, P Eles
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (12 …, 2015
122015
Process-variation aware multi-temperature test scheduling
N Aghaee, Z Peng, P Eles
2014 27th International Conference on VLSI Design and 2014 13th …, 2014
82014
Process-variation and temperature aware soc test scheduling using particle swarm optimization
N Aghaee, Z Peng, P Eles
2011 IEEE 6th International Design and Test Workshop (IDT), 1-6, 2011
82011
Design of a pipelined R4SDF processor
N Aghaee, M Eshghi
2009 17th European Signal Processing Conference, 963-967, 2009
62009
Temperature-gradient based test scheduling for 3D stacked ICs
N Aghaee, Z Peng, P Eles
2013 IEEE 20th International Conference on Electronics, Circuits, and …, 2013
52013
An integrated temperature-cycling acceleration and test technique for 3D stacked ICs
N Aghaee, Z Peng, P Eles
The 20th Asia and South Pacific Design Automation Conference, 526-531, 2015
42015
A Test-Ordering Based Temperature-Cycling Acceleration Technique for 3D Stacked ICs
N Aghaee, Z Peng, P Eles
Journal of electronic testing, 2015
22015
Thermal Issues in Testing of Advanced Systems on Chip
N Aghaee
http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-120798, 2015
2*2015
Computer Aided Design of Electronics
Z Peng, P Eles, N Aghaee
22013
A Pipelined Architecture for a 20-point PFA
N Aghaee, M Eshghi
TENCON 2006-2006 IEEE Region 10 Conference, 1-4, 2006
22006
Efficient Test Application for Rapid Multi-Temperature Testing
N Aghaee, Z Peng, P Eles
25th Great Lakes Symposium on VLSI (GLSVLSI'15), 3-8, 2015
2015
TDTS01> Lectures
N Aghaee
Linköping University, 2014
2014
TDTS01> Labs
N Aghaee
Linköping University, 2014
2014
TDTS01> Examination
N Aghaee
Linköping University, 2014
2014
TDTS01> Home page
N Aghaee
Linköping University, 2014
2014
TDTS01> Timetable
N Aghaee
Linköping University, 2014
2014
The system can't perform the operation now. Try again later.
Articles 1–20