Hamzeh Eyal Salman
Hamzeh Eyal Salman
Associate Professor in Software Engineering, Mutah University
Verified email at mutah.edu.jo
Title
Cited by
Cited by
Year
Distance and Similarity Measures Effect on the Performance of K-Nearest Neighbor Classifier--A Review
VB Prasath, HAA Alfeilat, A Hassanat, O Lasassmeh, AS Tarawneh, ...
arXiv preprint arXiv:1708.04321, 2017
642017
Feature location in a collection of software product variants using formal concept analysis
AL Ra’Fat, A Seriai, M Huchard, C Urtado, S Vauttier, HE Salman
International Conference on Software Reuse, 302-307, 2013
452013
Feature-to-code traceability in a collection of software variants: Combining formal concept analysis and information retrieval
H Eyal-Salman, AD Seriai, C Dony
2013 IEEE 14th International Conference on Information Reuse & Integration …, 2013
432013
Effects of distance measure choice on k-nearest neighbor classifier performance: a review
HA Abu Alfeilat, ABA Hassanat, O Lasassmeh, AS Tarawneh, ...
Big data 7 (4), 221-248, 2019
422019
Mining features from the object-oriented source code of a collection of software variants using formal concept analysis and latent semantic indexing
AD Seriai, M Huchard, C Urtado, S Vauttier, H Eyal-Salman
SEKE: Software Engineering and Knowledge Engineering, 2013
342013
Feature Location in a Collection of Product Variants: Combining Information Retrieval and Hierarchical Clustering
ES Hamzeh, S Abdelhak-Djamal, D Christophe
Software Engineering and Knowledge Engineering (SEKE'26), 2014
20*2014
Using Genetic algorithm as test data generator for stored PL/SQL program units
MA Alshraideh, BA Mahafzah, H Eyal Salman, I Salah
Journal of software engineering and applications 6 (02), 65, 2013
162013
Recovering traceability links between feature models and source code of product variants
H Eyal-Salman, AD Seriai, C Dony, R Al-msie'deen
Proceedings of the VARiability for You Workshop: Variability Modeling Made …, 2012
102012
Feature-level change impact analysis using formal concept analysis
H Eyal Salman, AD Seriai, C Dony
International Journal of Software Engineering and Knowledge Engineering 25 …, 2015
82015
Feature-to-code traceability in legacy software variants
H Eyal-Salman, AD Seriai, C Dony
2013 39th Euromicro Conference on Software Engineering and Advanced …, 2013
82013
Identifying traceability links between product variants and their features
H Eyal-Salman, AD Seriai, C Dony, R Almsie’deen
Ser. REVE'13, 17-23, 2013
82013
Semantic clustering of functional requirements using agglomerative hierarchical clustering
H Eyal Salman, M Hammad, AD Seriai, A Al-Sbou
Information 9 (9), 222, 2018
72018
Identification multi-level frequent usage patterns from apis
HE Salman
Journal of Systems and Software 130, 42-56, 2017
72017
Toward recovering component-based software product line architecture from object-oriented product variants
H Eyal-Salman, AD Seriai
SEKE: Software Engineering and Knowledge Engineering, 1-7, 2016
62016
Genetic Algorithms as Recovering Traceability Links Method between Feature Models and Source Code of Product Variants
ES Hamzeh, S Abdelhak-Djamel, D Christophe, A Ra’fat
Journée Lignes de Produits, 2012, 2012
5*2012
Distance and Similarity Measures Effect on the Performance of K-Nearest Neighbor Classifier--A Review
VB Surya Prasath, H Arafat Abu Alfeilat, A Hassanat, O Lasassmeh, ...
arXiv e-prints, arXiv: 1708.04321, 2017
22017
Quality-driven feature identification and documentation from source code
H Eyal-Salman, AD Seriai, M Hammad
Journal of Theoretical and Applied Information Technology 84 (2), 183-195, 2016
22016
API library-based identification and documentation of usage patterns
HE Salman
International Journal of Computer Applications in Technology 58 (1), 63-79, 2018
12018
Feature-to-code traceability in a collection of product variants using formal concept analysis and information retrieval
H Eyal-Salman, A Seriai, C Dony
39th euromicro conference on software engineering and advanced applications …, 2013
12013
An approach to recover feature models from object-oriented source code
AD Seriai, M Huchard, C Urtado, S Vauttier, H Eyal-Salman
Journée Lignes de Produits, 2012
12012
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Articles 1–20