Flooding region growing: a new parallel image segmentation model based on membrane computing M Dalvand, A Fathi, A Kamran Journal of Real-Time Image Processing 18 (1), 37-55, 2021 | 8 | 2021 |
Stochastic testing of processing cores in a many-core architecture A Kamran, Z Navabi Integration 55, 183-193, 2016 | 7 | 2016 |
Hardware acceleration of online error detection in many-core processors A Kamran, Z Navabi Canadian Journal of Electrical and Computer Engineering 38 (2), 143-153, 2015 | 7 | 2015 |
Online periodic test mechanism for homogeneous many-core processors A Kamran, Z Navabi 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration …, 2013 | 7 | 2013 |
Optimising cure cycle of unsaturated polyester nanocomposites using directed grid search method M Poorabdollah, A Kamran Polymers and Polymer Composites 27 (5), 253-261, 2019 | 6 | 2019 |
Optimizing cure cycle of nanoclay-reinforced unsaturated polyester resins considering various curing kinetic models M Poorabdollah, A Kamran Journal of Composite Materials 52 (1), 27-36, 2018 | 6 | 2018 |
Virtual tester development using HDL/PLI A Kamran, N Nemati, SS Kohan, Z Navabi 2010 East-West Design & Test Symposium (EWDTS), 412-415, 2010 | 5 | 2010 |
Spiking Neural P System with weight model of majority voting technique for reliable interactive image segmentation M Dalvand, A Fathi, A Kamran Neural Computing and Applications 35 (12), 9035-9051, 2023 | 4 | 2023 |
Hasti: hardware‐assisted functional testing of embedded processors in idle times A Kamran IET Computers & Digital Techniques 13 (3), 198-205, 2019 | 4 | 2019 |
Self-healing many-core architecture: analysis and evaluation A Kamran, Z Navabi VLSI Design 2016, 2016 | 4 | 2016 |
Homogeneous many-core processor system test distribution and execution mechanism A Kamran, Z Navabi 2014 19th IEEE European Test Symposium (ETS), 1-2, 2014 | 4 | 2014 |
Dual-purpose custom instruction identification algorithm based on particle swarm optimization M Kamal, NK Amiri, A Kamran, SA Hoseini, M Dehyadegari, H Noori ASAP 2010-21st IEEE International Conference on Application-specific Systems …, 2010 | 4 | 2010 |
Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation S Sadeghi-Kohan, A Kamran, F Forooghifar, Z Navabi 2015 10th International Conference on Design & Technology of Integrated …, 2015 | 3 | 2015 |
Merit based directed random test generation (MDRTG) scheme for combinational circuits A Kamran, MS Jahangiry, Z Navabi 2010 East-West Design & Test Symposium (EWDTS), 416-419, 2010 | 3 | 2010 |
Speed-Up in Test Methods Using Probabilistic Merit Indicators M Fooladi, A Kamran Journal of Electronic Testing 36 (2), 285-296, 2020 | 2 | 2020 |
SAMA: Self-adjusting multi-cycle approximate adder E Baratalipour, A Kamran Microelectronics Journal 134, 105740, 2023 | 1 | 2023 |
UT mixed-signal simulator H Ghasemi, A Gharehbaghi, A Kamran, S Abolmaali, Z Navabi Design Automation and Test in Europe (DATE 2007), 2007 | 1 | 2007 |
Approximate Fault Simulation for Quick Evaluation of Test Patterns in Digital Circuit Testing L Khosravi, A Kamran Tabriz Journal of Electrical Engineering 51 (3), 347-357, 2022 | | 2022 |
Extracting complete set of equations to analyze VHDL-AMS descriptions A Kamran, V Janfaza, Z Navabi East-West Design & Test Symposium (EWDTS 2013), 1-4, 2013 | | 2013 |