| Adaptation of an electrochemistry-based li-ion battery model to account for deterioration observed under randomized use B Bole, CS Kulkarni, M Daigle Annual conference of the prognostics and health management society, 2014 | 107 | 2014 |
| Prognostics Approach for Power MOSFET under Thermal-Stress Aging J Celaya, A Saxena, CS Kulkarni, S Saha, K Goebel Proceedings - Annual Reliability and Maintainability Symposium (RAMS), 2012, 1-6, 2012 | 94 | 2012 |
| A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging JR Celaya, C Kulkarni, G Biswas, S Saha, K Goebel Proceeding of Annual Conference of the Prognostics and Health Management …, 2011 | 81* | 2011 |
| Electrochemistry-based Battery Modeling for Prognostics M Daigle, CS Kulkarni Annual Conference of the Prognostics and Health Management Society 2013, 249-261, 2013 | 78 | 2013 |
| Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring C Kulkarni, G Biswas, X Koutsoukos, J Celaya, K Goebel IEEE AUTOTESTCON, 1-7, 2010 | 58 | 2010 |
| Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress CS Kulkarni, JR Celaya, K Goebel, G Biswas 1st European Conference of the Prognostics and Health Management Society, 1-9, 2012 | 55 | 2012 |
| A prognosis case study for electrolytic capacitor degradation in DC-DC converters C Kulkarni, G Biswas, X Koutsoukos Proceeding of Annual Conference of the Prognostics and Health Management …, 2009 | 53 | 2009 |
| Randomized battery usage data set B Bole, C Kulkarni, M Daigle NASA AMES prognostics data repository 70, 2014 | 43 | 2014 |
| Physics of failure models for capacitor degradation in DC-DC converters C Kulkarni, G Biswas, X Koutsoukos, K Goebel, J Celaya The Maintenance and Reliability Conference, MARCON, 2010 | 42 | 2010 |
| Accelerated Aging in Electrolytic Capacitors for Prognostics J Celaya, C Kulkarni, S Saha, G Biswas, K Goebel Proceedings Annual Reliability and Maintainability Symposium (RAMS), 2012, 1-6, 2012 | 34 | 2012 |
| Battery health management for small-size rotary-wing electric unmanned aerial vehicles: An efficient approach for constrained computing platforms G Sierra, M Orchard, K Goebel, C Kulkarni Reliability Engineering & System Safety 182, 166-178, 2019 | 32 | 2019 |
| End-of-discharge and end-of-life prediction in lithium-ion batteries with electrochemistry-based aging models M Daigle, CS Kulkarni AIAA Infotech@ aerospace, 2132, 2016 | 32 | 2016 |
| Accelerated aging experiments for capacitor health monitoring and prognostics CS Kulkarni, JR Celaya, G Biswas, K Goebel 2012 IEEE AUTOTESTCON Proceedings, 356-361, 2012 | 29 | 2012 |
| Experimental studies of ageing in electrolytic capacitors C Kulkarni, G Biswas, X Koutsoukos, J Celaya, K Goebel Proceeding of Annual Conference of the Prognostics and Health Management Society, 2010 | 26 | 2010 |
| Physics Based Degradation Models for Electrolytic Capacitor Prognostics under Thermal Overstress Conditions CS Kulkarni, G Biswas, JR Celaya, K Goebel International Journal of the PHM Society 4 (1), 13, 2013 | 25 | 2013 |
| Prognostic Techniques for Capacitor Degradation and Health Monitoring C Kulkarni, G Biswas, J Celaya, K Goebel The Maintenance & Reliability Conference, MARCON 2011, 1-14, 2011 | 22 | 2011 |
| Towards A Model-Based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging C Kulkarni, J Celaya, G Biswas, K Goebel International Journal of Prognostics and Health Management 5 (1), 16, 2012 | 21* | 2012 |
| Towards Prognostic of Electrolytic Capacitors J Celaya, CS Kulkarni, G Biswas, K Goebel American Institute of Aeronautics and Astronautics, Infotech@Aerospace 2011, 2011 | 20 | 2011 |
| Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors CS Kulkarni, JR Celaya, G Biswas, K Goebel AIAA Infotech@Aerospace Conference 1, 1-7, 2012 | 19* | 2012 |
| Fusing physics-based and deep learning models for prognostics MA Chao, C Kulkarni, K Goebel, O Fink Reliability Engineering & System Safety 217, 107961, 2022 | 18* | 2022 |
Kai GoebelPalo Alto Research CenterVerified email at parc.com
