Interpreting deep-learned error-correcting codes N Devroye, N Mohammadi, A Mulgund, H Naik, R Shekhar, G Turán, ... 2022 IEEE International Symposium on Information Theory (ISIT), 2457-2462, 2022 | 9 | 2022 |
APUF Faults: Impact, Testing, and Diagnosis Y Wei, T Fox, V Dumoulin, W Rao, N Devroye 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022 | 2 | 2022 |