James LeBeau
Title
Cited by
Cited by
Year
Quantitative atomic resolution scanning transmission electron microscopy
JM LeBeau, SD Findlay, LJ Allen, S Stemmer
Physical Review Letters 100 (20), 206101, 2008
3722008
Physical Mechanisms behind the Field‐Cycling Behavior of HfO2‐Based Ferroelectric Capacitors
M Pešić, FPG Fengler, L Larcher, A Padovani, T Schenk, ED Grimley, ...
Advanced Functional Materials 26 (25), 4601-4612, 2016
2462016
Experimental quantification of annular dark-field images in scanning transmission electron microscopy
JM LeBeau, S Stemmer
Ultramicroscopy 108 (12), 1653-1658, 2008
2272008
On the structural origins of ferroelectricity in HfO2 thin films
X Sang, ED Grimley, T Schenk, U Schroeder, JM LeBeau
Applied Physics Letters 106 (16), 162905, 2015
2232015
Low-dimensional Mott material: Transport in ultrathin epitaxial films
J Son, P Moetakef, JM LeBeau, D Ouellette, L Balents, SJ Allen, ...
Applied Physics Letters 96 (6), 062114, 2010
2012010
Standardless atom counting in scanning transmission electron microscopy
JM LeBeau, SD Findlay, LJ Allen, S Stemmer
Nano Letters 10 (11), 4405-4408, 2010
1932010
Position averaged convergent beam electron diffraction: Theory and applications
JM LeBeau, SD Findlay, LJ Allen, S Stemmer
Ultramicroscopy 110 (2), 118-125, 2010
1912010
Revolving scanning transmission electron microscopy: Correcting sample drift distortion without prior knowledge
X Sang, JM LeBeau
Ultramicroscopy 138, 28-35, 2014
1652014
Giant piezoelectricity of Sm-doped Pb (Mg1/3Nb2/3) O3-PbTiO3 single crystals
F Li, MJ Cabral, B Xu, Z Cheng, EC Dickey, JM LeBeau, J Wang, J Luo, ...
Science 364 (6437), 264-268, 2019
1462019
Structural Changes Underlying Field‐Cycling Phenomena in Ferroelectric HfO2 Thin Films
ED Grimley, T Schenk, X Sang, M Pešić, U Schroeder, T Mikolajick, ...
Advanced Electronic Materials 2 (9), 1600173, 2016
1272016
Spin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCo
C Niu, AJ Zaddach, AA Oni, X Sang, JW Hurt III, JM LeBeau, CC Koch, ...
Applied Physics Letters 106 (16), 161906, 2015
1212015
High-angle scattering of fast electrons from crystals containing heavy elements: Simulation and experiment
JM LeBeau, SD Findlay, X Wang, AJ Jacobson, LJ Allen, S Stemmer
Physical Review B 79 (21), 214110, 2009
1032009
A comprehensive study on the structural evolution of HfO 2 thin films doped with various dopants
MH Park, T Schenk, CM Fancher, ED Grimley, C Zhou, C Richter, ...
Journal of Materials Chemistry C 5 (19), 4677-4690, 2017
1002017
Transition from battery to pseudocapacitor behavior via structural water in tungsten oxide
JB Mitchell, WC Lo, A Genc, J LeBeau, V Augustyn
Chemistry of Materials 29 (9), 3928-3937, 2017
822017
Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes
PD Lomenzo, P Zhao, Q Takmeel, S Moghaddam, T Nishida, M Nelson, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014
792014
Si doped hafnium oxide—A “fragile” ferroelectric system
C Richter, T Schenk, MH Park, FA Tscharntke, ED Grimley, JM LeBeau, ...
Advanced Electronic Materials 3 (10), 1700131, 2017
712017
Conductivity enhancement of ultrathin films in superlattices
J Son, JM LeBeau, SJ Allen, S Stemmer
Applied Physics Letters 97 (20), 202109, 2010
652010
Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images
JM LeBeau, AJ D’Alfonso, SD Findlay, S Stemmer, LJ Allen
Physical Review B 80 (17), 174106, 2009
652009
Detector non-uniformity in scanning transmission electron microscopy
SD Findlay, JM LeBeau
Ultramicroscopy 124, 52-60, 2013
522013
Atom column indexing: atomic resolution image analysis through a matrix representation
X Sang, AA Oni, JM LeBeau
Microscopy and Microanalysis 20 (6), 1764-1771, 2014
492014
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Articles 1–20