| Automated and scalable t-wise test case generation strategies for software product lines G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon Software Testing, Verification and Validation (ICST), 2010 Third …, 2010 | 306 | 2010 |
| Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon IEEE Transactions on Software Engineering 40 (7), 650-670, 2014 | 234 | 2014 |
| On extracting feature models from product descriptions M Acher, A Cleve, G Perrouin, P Heymans, C Vanbeneden, P Collet, ... Proceedings of the 6th International Workshop on Variability Modeling of …, 2012 | 205 | 2012 |
| Pairwise testing for software product lines: comparison of two approaches G Perrouin, S Oster, S Sen, J Klein, B Baudry, Y Le Traon Software Quality Journal 20, 605-643, 2012 | 193 | 2012 |
| Multi-objective test generation for software product lines C Henard, M Papadakis, G Perrouin, J Klein, YL Traon Proceedings of the 17th International Software Product Line Conference, 62-71, 2013 | 147 | 2013 |
| Reconciling automation and flexibility in product derivation G Perrouin, J Klein, N Guelfi, JM Jézéquel 2008 12th International Software Product Line Conference, 339-348, 2008 | 126 | 2008 |
| Assessing software product line testing via model-based mutation: An application to similarity testing C Henard, M Papadakis, G Perrouin, J Klein, Y Le Traon 2013 IEEE Sixth International Conference on Software Testing, Verification …, 2013 | 97 | 2013 |
| Simulation-Based Abstractions for Software Product-Line Model Checking M Cordy, A Classen, G Perrouin, P Heymans, PY Schobbens, A Legay | 86 | 2011 |
| Test them all, is it worth it? Assessing configuration sampling on the JHipster Web development stack A Halin, A Nuttinck, M Acher, X Devroey, G Perrouin, B Baudry Empirical Software Engineering 24, 674-717, 2019 | 85 | 2019 |
| Simulation-based abstractions for software product-line model checking M Cordy, A Classen, G Perrouin, PY Schobbens, P Heymans, A Legay 2012 34th International Conference on Software Engineering (ICSE), 672-682, 2012 | 78 | 2012 |
| Towards statistical prioritization for software product lines testing X Devroey, G Perrouin, M Cordy, PY Schobbens, A Legay, P Heymans The Eighth International Workshop on Variability Modelling of Software …, 2014 | 72 | 2014 |
| Towards statistical prioritization for software product lines testing X Devroey, M Cordy, G Perrouin, PY Schobbens, A Legay, P Heymans arXiv preprint arXiv:1310.2474, 2013 | 72 | 2013 |
| Uniform sampling of sat solutions for configurable systems: Are we there yet? Q Plazar, M Acher, G Perrouin, X Devroey, M Cordy 2019 12th IEEE Conference on Software Testing, Validation and Verification …, 2019 | 69 | 2019 |
| Featured Model-based Mutation Analysis X Devroey, G Perrouin, M Papadakis, A Legay, PY Schobbens, ... International Conference on Software Engineering (ICSE), 2016 | 66 | 2016 |
| Weaving variability into domain metamodels B Morin, G Perrouin, P Lahire, O Barais, G Vanwormhoudt, JM Jézéquel Model Driven Engineering Languages and Systems, 690-705, 2009 | 66 | 2009 |
| Towards automated testing and fixing of re-engineered feature models C Henard, M Papadakis, G Perrouin, J Klein, Y Le Traon 2013 35th International Conference on Software Engineering (ICSE), 1245-1248, 2013 | 54 | 2013 |
| Dynamic software product lines for service-based systems P Istoan, G Nain, G Perrouin, JM Jézéquel 2009 Ninth IEEE International Conference on Computer and Information …, 2009 | 52 | 2009 |
| Statistical prioritization for software product line testing: an experience report X Devroey, G Perrouin, M Cordy, H Samih, A Legay, PY Schobbens, ... Software & Systems Modeling 16 (1), 153-171, 2017 | 49 | 2017 |
| Coverage criteria for behavioural testing of software product lines X Devroey, G Perrouin, A Legay, M Cordy, PY Schobbens, P Heymans International Symposium On Leveraging Applications of Formal Methods …, 2014 | 44 | 2014 |
| Search-based Similarity-driven Behavioural SPL Testing X Devroey, G Perrouin, A Legay, PY Schobbens, P Heymans Proceedings of the Tenth International Workshop on Variability Modelling of …, 2016 | 40 | 2016 |
Patrick HeymansProfesseur d'Informatique, Université de NamurVerified email at unamur.be
