When single event upset meets deep neural networks: Observations, explorations, and remedies Z Yan, Y Shi, W Liao, M Hashimoto, X Zhou, C Zhuo 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 163-168, 2020 | 42 | 2020 |
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs W Liao, M Hashimoto, S Manabe, Y Watanabe, S Abe, K Nakano, H Sato, ... IEEE Transactions on Nuclear Science 65 (8), 1734-1741, 2018 | 26 | 2018 |
Negative and positive muon-induced single event upsets in 65-nm UTBB SOI SRAMs S Manabe, Y Watanabe, W Liao, M Hashimoto, K Nakano, H Sato, T Kin, ... IEEE Transactions on Nuclear Science 65 (8), 1742-1749, 2018 | 20 | 2018 |
Similarity analysis on neutron-and negative muon-induced MCUs in 65-nm bulk SRAM W Liao, M Hashimoto, S Manabe, S Abe, Y Watanabe IEEE Transactions on Nuclear Science 66 (7), 1390-1397, 2019 | 19 | 2019 |
Impact of irradiation side on neutron-induced single-event upsets in 65-nm bulk SRAMs S Abe, W Liao, S Manabe, T Sato, M Hashimoto, Y Watanabe IEEE Transactions on Nuclear Science 66 (7), 1374-1380, 2019 | 17 | 2019 |
Estimation of muon-induced SEU rates for 65-nm bulk and UTBB-SOI SRAMs S Manabe, Y Watanabe, W Liao, M Hashimoto, SI Abe IEEE Transactions on Nuclear Science 66 (7), 1398-1403, 2019 | 16 | 2019 |
Soft error rate estimation with TCAD and machine learning M Hashimoto, W Liao, S Hirokawa 2017 International Conference on Simulation of Semiconductor Processes and …, 2017 | 13 | 2017 |
Q3DE: A fault-tolerant quantum computer architecture for multi-bit burst errors by cosmic rays Y Suzuki, T Sugiyama, T Arai, W Liao, K Inoue, T Tanimoto 2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO …, 2022 | 12 | 2022 |
Irradiation test of 65-nm bulk SRAMs with DC muon beam at RCNP-MuSIC facility T Mahara, S Manabe, Y Watanabe, W Liao, M Hashimoto, TY Saito, ... IEEE Transactions on Nuclear Science 67 (7), 1555-1559, 2020 | 9 | 2020 |
Soft error and its countermeasures in terrestrial environment M Hashimoto, W Liao 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 617-622, 2020 | 8 | 2020 |
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs W Liao, M Hashimoto, S Manabe, Y Watanabe, S Abe, K Nakano, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 8 | 2019 |
Characterizing energetic dependence of low-energy neutron-induced SEU and MCU and its influence on estimation of terrestrial SER in 65-nm bulk SRAM W Liao, K Ito, S Abe, Y Mitsuyama, M Hashimoto IEEE Transactions on Nuclear Science 68 (6), 1228-1234, 2021 | 6 | 2021 |
Measurement of single-event upsets in 65-nm SRAMs under irradiation of spallation neutrons at J-PARC MLF J Kuroda, S Manabe, Y Watanabe, K Ito, W Liao, M Hashimoto, S Abe, ... IEEE Transactions on Nuclear Science 67 (7), 1599-1605, 2020 | 5 | 2020 |
Development of autonomous driving system using programmable SoCs T Tanaka, I Ikeno, R Tsuruoka, T Kuchiba, W Liao, Y Mitsuyama 2019 International Conference on Field-Programmable Technology (ICFPT), 453-456, 2019 | 5 | 2019 |
Analyzing impacts of SRAM, FF and combinational circuit on chip-level neutron-induced soft error rate W Liao, M Hashimoto IEICE Transactions on Electronics 102 (4), 296-302, 2019 | 5 | 2019 |
Single-joint driving system of bionic finger based on shape memory alloy B Sun, J Zhang, X Wu, W Liao 2012 International Symposium on Micro-NanoMechatronics and Human Science …, 2012 | 5 | 2012 |
Wit-greedy: hardware system design of weighted iterative greedy decoder for surface code W Liao, Y Suzuki, T Tanimoto, Y Ueno, Y Tokunaga Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023 | 4 | 2023 |
Impact of hydrided and non-hydrided materials near transistors on neutron-induced single event upsets S Abe, T Sato, J Kuroda, S Manabe, Y Watanabe, W Liao, K Ito, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2020 | 4 | 2020 |
Contributions of SRAM, FF and combinational circuit to chip-level neutron-induced soft error rate:-Bulk vs. FD-SOI at 0.5 and 1.0 V W Liao, S Hirokawa, R Harada, M Hashimoto 2017 15th IEEE International New Circuits and Systems Conference (NEWCAS), 33-36, 2017 | 4 | 2017 |
Processor ser estimation with ace bit analysis TS Hsu, D Yang, W Liao, M Itoh, M Hashimoto, JJ Liou 2021 21th European Conference on Radiation and Its Effects on Components and …, 2021 | 3 | 2021 |