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Wang LIAO
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When single event upset meets deep neural networks: Observations, explorations, and remedies
Z Yan, Y Shi, W Liao, M Hashimoto, X Zhou, C Zhuo
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 163-168, 2020
402020
Measurement and Mechanism Investigation of Negative and Positive Muon-Induced Upsets in 65-nm Bulk SRAMs
W Liao, M Hashimoto, S Manabe, Y Watanabe, S Abe, K Nakano, H Sato, ...
IEEE Transactions on Nuclear Science 65 (8), 1734-1741, 2018
242018
Negative and positive muon-induced single event upsets in 65-nm UTBB SOI SRAMs
S Manabe, Y Watanabe, W Liao, M Hashimoto, K Nakano, H Sato, T Kin, ...
IEEE Transactions on Nuclear Science 65 (8), 1742-1749, 2018
172018
Similarity analysis on neutron-and negative muon-induced MCUs in 65-nm bulk SRAM
W Liao, M Hashimoto, S Manabe, S Abe, Y Watanabe
IEEE Transactions on Nuclear Science 66 (7), 1390-1397, 2019
162019
Estimation of muon-induced SEU rates for 65-nm bulk and UTBB-SOI SRAMs
S Manabe, Y Watanabe, W Liao, M Hashimoto, SI Abe
IEEE Transactions on Nuclear Science 66 (7), 1398-1403, 2019
152019
Soft error rate estimation with TCAD and machine learning
M Hashimoto, W Liao, S Hirokawa
2017 International Conference on Simulation of Semiconductor Processes and …, 2017
132017
Impact of irradiation side on neutron-induced single-event upsets in 65-nm bulk SRAMs
S Abe, W Liao, S Manabe, T Sato, M Hashimoto, Y Watanabe
IEEE Transactions on Nuclear Science 66 (7), 1374-1380, 2019
112019
Q3DE: A fault-tolerant quantum computer architecture for multi-bit burst errors by cosmic rays
Y Suzuki, T Sugiyama, T Arai, W Liao, K Inoue, T Tanimoto
2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO …, 2022
92022
Soft error and its countermeasures in terrestrial environment
M Hashimoto, W Liao
2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 617-622, 2020
82020
Irradiation test of 65-nm bulk SRAMs with DC muon beam at RCNP-MuSIC facility
T Mahara, S Manabe, Y Watanabe, W Liao, M Hashimoto, TY Saito, ...
IEEE Transactions on Nuclear Science 67 (7), 1555-1559, 2020
72020
Negative and Positive Muon-Induced SEU Cross Sections in 28-nm and 65-nm Planar Bulk CMOS SRAMs
W Liao, M Hashimoto, S Manabe, Y Watanabe, S Abe, K Nakano, ...
2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019
72019
Characterizing energetic dependence of low-energy neutron-induced SEU and MCU and its influence on estimation of terrestrial SER in 65-nm bulk SRAM
W Liao, K Ito, S Abe, Y Mitsuyama, M Hashimoto
IEEE Transactions on Nuclear Science 68 (6), 1228-1234, 2021
62021
Measurement of single-event upsets in 65-nm SRAMs under irradiation of spallation neutrons at J-PARC MLF
J Kuroda, S Manabe, Y Watanabe, K Ito, W Liao, M Hashimoto, S Abe, ...
IEEE Transactions on Nuclear Science 67 (7), 1599-1605, 2020
52020
Analyzing impacts of SRAM, FF and combinational circuit on chip-level neutron-induced soft error rate
W Liao, M Hashimoto
IEICE Transactions on Electronics 102 (4), 296-302, 2019
52019
Single-joint driving system of bionic finger based on shape memory alloy
B Sun, J Zhang, X Wu, W Liao
2012 International Symposium on Micro-NanoMechatronics and Human Science …, 2012
52012
Wit-greedy: hardware system design of weighted iterative greedy decoder for surface code
W Liao, Y Suzuki, T Tanimoto, Y Ueno, Y Tokunaga
Proceedings of the 28th Asia and South Pacific Design Automation Conference …, 2023
42023
Impact of hydrided and non-hydrided materials near transistors on neutron-induced single event upsets
S Abe, T Sato, J Kuroda, S Manabe, Y Watanabe, W Liao, K Ito, ...
2020 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2020
42020
Development of autonomous driving system using programmable SoCs
T Tanaka, I Ikeno, R Tsuruoka, T Kuchiba, W Liao, Y Mitsuyama
2019 International Conference on Field-Programmable Technology (ICFPT), 453-456, 2019
42019
Contributions of SRAM, FF and combinational circuit to chip-level neutron-induced soft error rate:-Bulk vs. FD-SOI at 0.5 and 1.0 V
W Liao, S Hirokawa, R Harada, M Hashimoto
2017 15th IEEE International New Circuits and Systems Conference (NEWCAS), 33-36, 2017
42017
Processor ser estimation with ace bit analysis
TS Hsu, D Yang, W Liao, M Itoh, M Hashimoto, JJ Liou
2021 21th European Conference on Radiation and Its Effects on Components and …, 2021
32021
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