| Nanometer‐scale lithography using the atomic force microscope A Majumdar, PI Oden, JP Carrejo, LA Nagahara, JJ Graham, J Alexander Applied Physics Letters 61 (19), 2293-2295, 1992 | 303 | 1992 |
| Scanning probe microscope FI Linker, MD Kirk, JD Alexander, S Park, S Park, IR Smith US Patent 5,376,790, 1994 | 126 | 1994 |
| Design of an atomic force microscope with interferometric position control J Schneir, TH McWaid, J Alexander, BP Wilfley Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1994 | 119 | 1994 |
| Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials S Magonov, J Alexander Beilstein journal of nanotechnology 2 (1), 15-27, 2011 | 76 | 2011 |
| Resistivity and transverse magnetoresistance in ultrathin films of pure bismuth HT Chu, PN Henriksen, J Alexander Physical Review B 37 (8), 3900, 1988 | 54 | 1988 |
| Single axis vibration reducing system JD Alexander, MD Kirk US Patent 5,811,821, 1998 | 43 | 1998 |
| Compositional mapping of bitumen using local electrostatic force interactions in atomic force microscopy S Magonov, J Alexander, M Surtchev, AM Hung, EH Fini Journal of microscopy 265 (2), 196-206, 2017 | 36 | 2017 |
| Atomic force microscope with integrated optics for attachment to optical microscope JD Alexander, M Tortonese, T Nguyen US Patent 5,952,657, 1999 | 36 | 1999 |
| Topography and surface potential in Kelvin force microscopy of perfluoroalkyl alkanes self-assemblies J Alexander, S Magonov, M Moeller Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2009 | 35 | 2009 |
| Inelastic electron tunneling spectroscopy of silane coupling agents adsorbed on alumina JD Alexander, AN Gent, PN Henriksen The Journal of chemical physics 83 (11), 5981-5987, 1985 | 33 | 1985 |
| Thermal tune method for AFM oscillatory resonant imaging in air and liquid S Belikov, J Alexander, C Wall, I Yermolenko, S Magonov, I Malovichko 2014 American Control Conference, 1009-1014, 2014 | 26 | 2014 |
| Tank probe for measuring surface conductance D Chen, J Alexander, A Samsavar US Patent 6,794,886, 2004 | 22* | 2004 |
| Advancing characterization of materials with atomic force microscopy-based electric techniques S Magonov, J Alexander, S Wu Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and …, 2010 | 21 | 2010 |
| Advanced Atomic force microscopy: Exploring measurements of local electric properties S Magonov, J Alexander Application Note, Agilent Technologies, Inc, 2008 | 18 | 2008 |
| Atomic force microscope for attachment to optical microscope JD Alexander, M Tortonese, T Nguyen US Patent 5,861,624, 1999 | 18 | 1999 |
| Tip-sample forces in atomic force microscopy: Interplay between theory and experiment S Belikov, J Alexander, C Wall, S Magonov MRS Online Proceedings Library 1527 (1), 204, 2013 | 15 | 2013 |
| Scanning probe microscope with multimode head S Park, FI Linker, IR Smith, M Kirk, J Alexander, S Park US Patent 6,130,427, 2000 | 14 | 2000 |
| Scanning probe based apparatus and methods for low-force profiling of sample surfaces and detection and mapping of local mechanical and electromagnetic properties in non … S Magonov, S Belikov, JD Alexander, CG Wall, S Leesment, V Bykov US Patent 9,110,092, 2015 | 12 | 2015 |
| An IETS study of surface reactions applicable to adhesion PN Henriksen, AN Gent, RD Ramsier, JD Alexander Surface and Interface Analysis 11 (6‐7), 283-286, 1988 | 12 | 1988 |
| Implementation of atomic force microscopy resonance modes based on asymptotic dynamics using Costas loop S Belikov, J Alexander, M Surtchev, S Magonov 2016 American Control Conference (ACC), 6201-6208, 2016 | 10 | 2016 |
Sergei MagonovSPM Labs LLCVerified email at spmlabs.com
