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Pamela M Norris
Pamela M Norris
Executive Dean and Frederick Tracy Morse Professor of Mechanical and Aerospace Engineering
Verified email at virginia.edu - Homepage
Title
Cited by
Cited by
Year
Microchip-based purification of DNA from biological samples
MC Breadmore, KA Wolfe, IG Arcibal, WK Leung, D Dickson, BC Giordano, ...
Analytical chemistry 75 (8), 1880-1886, 2003
5462003
Effects of temperature and disorder on thermal boundary conductance at solid–solid interfaces: Nonequilibrium molecular dynamics simulations
RJ Stevens, LV Zhigilei, PM Norris
International Journal of Heat and Mass Transfer 50 (19-20), 3977-3989, 2007
3732007
Toward a microchip‐based solid‐phase extraction method for isolation of nucleic acids
KA Wolfe, MC Breadmore, JP Ferrance, ME Power, JF Conroy, PM Norris, ...
Electrophoresis 23 (5), 727-733, 2002
3202002
Measurement of thermal boundary conductance of a series of metal-dielectric interfaces by the transient thermoreflectance technique
RJ Stevens, AN Smith, PM Norris
J. Heat Transfer 127 (3), 315-322, 2005
3132005
A review of recent advances in thermophysical properties at the nanoscale: From solid state to colloids
L Qiu, N Zhu, Y Feng, EE Michaelides, G Żyła, D Jing, X Zhang, PM Norris, ...
Physics Reports 843, 1-81, 2020
2982020
Measurement of the electron-phonon coupling factor dependence on film thickness and grain size in Au, Cr, and Al
JL Hostetler, AN Smith, DM Czajkowsky, PM Norris
Applied optics 38 (16), 3614-3620, 1999
2041999
Femtosecond pump–probe nondestructive examination of materials
PM Norris, AP Caffrey, RJ Stevens, JM Klopf, JT McLeskey Jr, AN Smith
Review of scientific instruments 74 (1), 400-406, 2003
1882003
Enhancing and tuning phonon transport at vibrationally mismatched solid-solid interfaces
TS English, JC Duda, JL Smoyer, DA Jordan, PM Norris, LV Zhigilei
Physical review B 85 (3), 035438, 2012
1712012
Effects of electron scattering at metal-nonmetal interfaces on electron-phonon equilibration in gold films
PE Hopkins, JL Kassebaum, PM Norris
Journal of Applied Physics 105 (2), 023710, 2009
1492009
Influence of inelastic scattering at metal-dielectric interfaces
PE Hopkins, PM Norris, RJ Stevens
Journal of Heat Transfer 130 (2), 2008
1432008
Influence of interfacial mixing on thermal boundary conductance across a chromium/silicon interface
PE Hopkins, PM Norris, RJ Stevens, TE Beechem, S Graham
Journal of Heat Transfer 130 (6), 2008
1372008
Anharmonic phonon interactions at interfaces and contributions to thermal boundary conductance
PE Hopkins, JC Duda, PM Norris
Journal of Heat Transfer 133 (6), 2011
1352011
Microchip-based macroporous silica sol− gel monolith for efficient isolation of DNA from clinical samples
Q Wu, JM Bienvenue, BJ Hassan, YC Kwok, BC Giordano, PM Norris, ...
Analytical chemistry 78 (16), 5704-5710, 2006
1282006
Role of interface disorder on thermal boundary conductance using a virtual crystal approach
T Beechem, S Graham, P Hopkins, P Norris
Applied Physics Letters 90 (5), 054104, 2007
1252007
Substrate influence in electron–phonon coupling measurements in thin Au films
PE Hopkins, PM Norris
Applied Surface Science 253 (15), 6289-6294, 2007
1142007
Role of dispersion on phononic thermal boundary conductance
JC Duda, TE Beechem, JL Smoyer, PM Norris, PE Hopkins
Journal of Applied Physics 108 (7), 073515, 2010
1092010
Extension of the diffuse mismatch model for thermal boundary conductance between isotropic and anisotropic materials
JC Duda, JL Smoyer, PM Norris, PE Hopkins
Applied Physics Letters 95 (3), 031912, 2009
1092009
Size effects on the thermal conductivity of amorphous silicon thin films
JL Braun, CH Baker, A Giri, M Elahi, K Artyushkova, TE Beechem, ...
Physical Review B 93 (14), 140201, 2016
1082016
Aerogels as biosensors: viral particle detection by bacteria immobilized on large pore aerogel
M Power, B Hosticka, E Black, C Daitch, P Norris
Journal of Non-Crystalline Solids 285 (1-3), 303-308, 2001
1042001
Thermal boundary resistance measurements using a transient thermoreflectance technique
AN Smith, JL Hostetler, PM Norris
Microscale Thermophysical Engineering 4 (1), 51-60, 2000
1002000
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