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Wook Lee
Wook Lee
Principal engineer at Samsung Electronics
Verified email at samsung.com - Homepage
Title
Cited by
Cited by
Year
A new atomic force microscope probe with force sensing integrated readout and active tip
AG Onaran, M Balantekin, W Lee, WL Hughes, BA Buchine, RO Guldiken, ...
Review of Scientific Instruments 77 (2), 2006
1182006
Rigorous coupled-wave analysis of multilayered grating structures
W Lee, FL Degertekin
Journal of Lightwave Technology 22 (10), 2359-2363, 2004
962004
Fabrication and characterization of a micromachined acoustic sensor with integrated optical readout
W Lee, NA Hall, Z Zhou, FL Degertekin
IEEE Journal of Selected Topics in Quantum Electronics 10 (3), 643-651, 2004
832004
A high fill-factor infrared bolometer using micromachined multilevel electrothermal structures
HK Lee, JB Yoon, E Yoon, SB Ju, YJ Yong, W Lee, SG Kim
IEEE Transactions on electron devices 46 (7), 1489-1491, 1999
791999
Advanced image sensor technology for pixel scaling down toward 1.0 µm
JC Ahn, CR Moon, B Kim, K Lee, Y Kim, M Lim, W Lee, H Park, K Moon, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
692008
Highly-sensitive displacement-measuring optical device
FL Degertekin, NA Hall, W Lee
US Patent 7,116,430, 2006
652006
Capacitive micromachined ultrasonic transducers with diffraction-based integrated optical displacement detection
NA Hall, W Lee, FL Degertekin
IEEE transactions on ultrasonics, ferroelectrics, and frequency control 50 …, 2003
582003
Micromachined microphones with diffraction-based optical displacement detection
NA Hall, B Bicen, MK Jeelani, W Lee, S Qureshi, FL Degertekin, ...
The Journal of the Acoustical Society of America 118 (5), 3000-3009, 2005
532005
Sensor for direct measurement of interaction forces in probe microscopy
FL Degertekin, AG Onaran, M Balantekin, W Lee, NA Hall, CF Quate
Applied Physics Letters 87 (21), 2005
482005
TM-polarized photon tunneling phase time in a frustrated-total-internal-reflection structure
B Lee, W Lee
JOSA B 14 (4), 777-781, 1997
361997
Highly-sensitive displacement-measuring optical device
FL Degertekin, NA Hall, W Lee
US Patent 7,440,117, 2008
342008
Displacement sensor employing discrete light pulse detection
FL Degertekin, W Lee, NA Hall
US Patent 7,485,847, 2009
332009
Image sensors
KH Lee, JC Ahn, DY Jang, W Lee, T Jung
US Patent 8,537,255, 2013
242013
A high fill-factor IR bolometer using multi-level electrothermal structures
HK Lee, JB Yoon, E Yoon, SB Ju, YJ Yong, W Lee, SG Kim
International Electron Devices Meeting 1998. Technical Digest (Cat. No …, 1998
231998
A grating-assisted resonant-cavity-enhanced optical displacement detection method for micromachined sensors
W Lee, NA Hall, FL Degertekin
Applied physics letters 85 (15), 3032-3034, 2004
202004
Rigorous coupled-wave analysis for multilayered grating structures
W Lee, FL Degertekin
Integrated Optics: Devices, Materials, and Technologies VII 4987, 264-273, 2003
182003
Micromachined acoustic sensor array with diffraction-based optical interferometric detection
W Lee, N Hall, FL Degertekin
MOEMS Display and Imaging Systems 4985, 140-151, 2003
142003
Micromachined capacitive transducers with improved optical detection for ultrasound applications in air
NA Hall, W Lee, J Dervan, FL Degertekin
2002 IEEE Ultrasonics Symposium, 2002. Proceedings. 2, 1027-1030, 2002
122002
Analog circuit design with Dyna-style reinforcement learning
W Lee, FA Oliehoek
arXiv preprint arXiv:2011.07665, 2020
92020
Capacitive micromachined ultrasonic transducers with integrated optoelectronic readout
FL Degertekin, NA Hall, W Lee
2001 IEEE Ultrasonics Symposium. Proceedings. An International Symposium …, 2001
92001
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