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Vincenzo Riccio
Vincenzo Riccio
Assistant Professor, Università di Udine
Verified email at uniud.it - Homepage
Title
Cited by
Cited by
Year
Taxonomy of real faults in deep learning systems
N Humbatova, G Jahangirova, G Bavota, V Riccio, A Stocco, P Tonella
Proceedings of the ACM/IEEE 42nd international conference on software …, 2020
2222020
Testing machine learning based systems: a systematic mapping
V Riccio, G Jahangirova, A Stocco, N Humbatova, M Weiss, P Tonella
Empirical Software Engineering 25, 5193-5254, 2020
1812020
Model-based exploration of the frontier of behaviours for deep learning system testing
V Riccio, P Tonella
Proceedings of the 28th ACM Joint Meeting on European Software Engineering …, 2020
1072020
Deephyperion: exploring the feature space of deep learning-based systems through illumination search
T Zohdinasab, V Riccio, A Gambi, P Tonella
Proceedings of the 30th ACM SIGSOFT International Symposium on Software …, 2021
552021
Sbst tool competition 2021
S Panichella, A Gambi, F Zampetti, V Riccio
2021 IEEE/ACM 14th International Workshop on Search-Based Software Testing …, 2021
532021
Why does the orientation change mess up my Android application? From GUI failures to code faults
D Amalfitano, V Riccio, ACR Paiva, AR Fasolino
Software Testing, Verification and Reliability 28 (1), e1654, 2018
432018
Combining automated gui exploration of android apps with capture and replay through machine learning
D Amalfitano, V Riccio, N Amatucci, V De Simone, AR Fasolino
Information and Software Technology 105, 95-116, 2019
402019
SBST tool competition 2022
A Gambi, G Jahangirova, V Riccio, F Zampetti
Proceedings of the 15th Workshop on Search-Based Software Testing, 25-32, 2022
322022
Deepmetis: Augmenting a deep learning test set to increase its mutation score
V Riccio, N Humbatova, G Jahangirova, P Tonella
2021 36th IEEE/ACM International Conference on Automated Software …, 2021
272021
Efficient and effective feature space exploration for testing deep learning systems
T Zohdinasab, V Riccio, A Gambi, P Tonella
ACM Transactions on Software Engineering and Methodology 32 (2), 1-38, 2023
222023
Do memories haunt you? An automated black box testing approach for detecting memory leaks in android apps
D Amalfitano, V Riccio, P Tramontana, AR Fasolino
IEEE Access 8, 12217-12231, 2020
202020
SBFT Tool Competition 2023-Cyber-Physical Systems Track
B Matteo, K Stefan, P Jarkko, V Riccio
Proceedings of the IEEE/ACM 45th International Conference on Software …, 2023
15*2023
When and why test generators for deep learning produce invalid inputs: an empirical study
V Riccio, P Tonella
2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE …, 2023
132023
Is this the lifecycle we really want? an automated black-box testing approach for Android activities
V Riccio, D Amalfitano, AR Fasolino
Companion Proceedings for the ISSTA/ECOOP 2018 Workshops, 68-77, 2018
132018
Towards a Thing-In-the-Loop approach for the verification and validation of IoT systems
D Amalfitano, N Amatucci, V De Simone, V Riccio, FA Rita
Proceedings of the 1st ACM Workshop on the Internet of Safe Things, 57-63, 2017
102017
Does Road Diversity Really Matter in Testing Automated Driving Systems?--A Registered Report
S Klikovits, V Riccio, E Castellano, A Cetinkaya, A Gambi, P Arcaini
arXiv preprint arXiv:2209.05947, 2022
32022
Comparing model coverage and code coverage in model driven testing: an exploratory study
D Amalfitano, V De Simone, AR Fasolino, V Riccio
2015 30th IEEE/ACM International Conference on Automated Software …, 2015
32015
DeepAtash: Focused Test Generation for Deep Learning Systems
Z Tahereh, V Riccio, T Paolo
Proceedings of the ACM SIGSOFT International Symposium on Software Testing …, 2023
1*2023
Enhancing Automated GUI Exploration Techniques for Android Mobile Applications
V Riccio
Università degli Studi di Napoli Federico II, 2019
12019
An Empirical Study on Low-and High-Level Explanations of Deep Learning Misbehaviours
T Zohdinasab, V Riccio, P Tonella
2023 ACM/IEEE International Symposium on Empirical Software Engineering and …, 2023
2023
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