samuel bassetto
samuel bassetto
Verified email at polymtl.ca
Title
Cited by
Cited by
Year
Modular design of product families for quality and cost
B Agard, S Bassetto
International Journal of Production Research 51 (6), 1648-1667, 2013
832013
Dynamic risk management unveil productivity improvements
A Mili, S Bassetto, A Siadat, M Tollenaere
Journal of Loss Prevention in the Process Industries 22 (1), 25-34, 2009
672009
Quality control planning to prevent excessive scrap production
B Bettayeb, SJ Bassetto, M Sahnoun
Journal of Manufacturing Systems 33 (3), 400-411, 2014
322014
Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing
M Sahnoun, B Bettayeb, SJ Bassetto, M Tollenaere
Journal of Intelligent Manufacturing 27 (6), 1335, 2016
262016
A method for a robust optimization of joint product and supply chain design
B Baud-Lavigne, S Bassetto, B Agard
Journal of Intelligent Manufacturing 27 (4), 741-749, 2016
262016
Quality and exposure control in semiconductor manufacturing. Part I: Modelling
B Bettayeb, S Bassetto, P Vialletelle, M Tollenaere
International Journal of Production Research 50 (23), 6835-6851, 2012
252012
A broader view of the economic design of the X-bar chart in the semiconductor industry
B Baud-Lavigne, S Bassetto, B Penz
International Journal of Production Research 48 (19), 5843-5857, 2010
252010
Operational methods for improving manufacturing control plans: case study in a semiconductor industry
S Bassetto, A Siadat
Journal of intelligent manufacturing 20 (1), 55-65, 2009
222009
Optimisation of the process control in a semiconductor company: model and case study of defectivity sampling
M Shanoun, S Bassetto, S Bastoini, P Vialletelle
International Journal of Production Research 49 (13), 3873-3890, 2011
192011
The management of process control deployment using interactions in risks analyses
S Bassetto, A Siadat, M Tollenaere
Journal of Loss Prevention in the Process Industries 24 (4), 458-465, 2011
162011
Optimized design of control plans based on risk exposure and resources capabilities
B Bettayeb, P Vialletelle, S Bassetto, M Tollenaere
2010 International Symposium on Semiconductor Manufacturing (ISSM), 1-4, 2010
122010
Contribution à la qualification et amélioration des moyens de production: application à une usine de recherche et production de semiconducteurs
S Bassetto
Paris, ENSAM, 2005
112005
Quality and exposure control in semiconductor manufacturing. Part II: Evaluation
B Bettayeb, S Bassetto, P Vialletelle, M Tollenaere
International Journal of Production Research 50 (23), 6852-6869, 2012
102012
Dynamic management of detected factory events and estimated risks using FMECA
A Mili, A Siadat, S Hubac, S Bassetto
2008 4th IEEE International Conference on Management of Innovation and …, 2008
102008
Contribution à la qualification et amélioration des moyens de production
S Bassetto
Application à une usine de recherche et production de semi-conducteurs, 2005
102005
Optimizing return on inspection trough defectivity smart sampling
M Sahnoun, P Vialletelle, S Bassetto, S Bastoini, M Tollenaere
2010 International Symposium on Semiconductor manufacturing (ISSM), 1-4, 2010
92010
Experiencing production ramp-up education for engineers
S Bassetto, V Fiegenwald, C Cholez, F Mangione
European Journal of Engineering Education 36 (4), 313-326, 2011
82011
Controlling non-conformities propagation in manufacturing
V Fiegenwald, S Bassetto, M Tollenaere
International Journal of Production Research 52 (14), 4118-4131, 2014
72014
Risks analyses update based on maintenance events
A Mili, S Hubac, S Bassetto, A Siadat
IFAC Proceedings Volumes 41 (2), 34-39, 2008
72008
Mastering process control using risks typologies
S Bassetto, A Siadat, P Martin
European Journal of Automated System (in French), 2006
62006
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