Duygu Akbulut
Duygu Akbulut
Verified email at asml.com
Title
Cited by
Cited by
Year
Scattering lens resolves sub-100 nm structures with visible light
EG van Putten, D Akbulut, J Bertolotti, WL Vos, A Lagendijk, AP Mosk
Physical review letters 106 (19), 193905, 2011
2932011
Focusing light through random photonic media by binary amplitude modulation
D Akbulut, TJ Huisman, EG van Putten, WL Vos, AP Mosk
Optics express 19 (5), 4017-4029, 2011
1662011
Ultralow threshold laser action from toroidal polymer microcavity
A Tulek, D Akbulut, M Bayindir
Applied Physics Letters 94 (20), 133, 2009
482009
Optical transmission matrix as a probe of the photonic strength
D Akbulut, T Strudley, J Bertolotti, EPAM Bakkers, A Lagendijk, ...
Physical Review A 94 (4), 043817, 2016
182016
Observation of intensity statistics of light transmitted through 3D random media
T Strudley, D Akbulut, WL Vos, A Lagendijk, AP Mosk, OL Muskens
Optics letters 39 (21), 6347-6350, 2014
112014
Method and apparatus for inspection and metrology
PD Van Voorst, D Akbulut, K Van Berkel, JJM Van De Wijdeven, F Zijp
US Patent 9,811,001, 2017
72017
Measurements of strong correlations in the transport of light through strongly scattering materials
D Akbulut
62013
Method and apparatus for inspection and metrology
F Zijp, ST VAN DER POST, K Fanhe, D Akbulut
US Patent 10,126,659, 2018
32018
Generation of new frequencies in toroid microcavities
D Akbulut, A Tulek, M Bayindir
2008 10th Anniversary International Conference on Transparent Optical …, 2008
32008
Metrology apparatus, lithographic system, and method of measuring a structure
J Ravensbergen, D Akbulut, N Pandey, L Jin
US Patent 10,444,640, 2019
22019
Measurements on the optical transmission matrices of strongly scattering nanowire layers
D Akbulut, T Strudley, J Bertolotti, T Zehender, EPAM Bakkers, ...
International Quantum Electronics Conference, IH_P_19, 2013
22013
Lasing action and supercontinuum generation in nano-and micro-structures
D Akbulut
bilkent university, 2009
22009
Method and apparatus for inspection and metrology
F Zijp, D Akbulut, PD Van Voorst, JJM Van De Wijdeven, K Van Berkel
US Patent 10,185,224, 2019
12019
Method and apparatus for inspection and metrology
K Van Berkel, D Akbulut, JJM Van De Wijdeven, F Zijp
US Patent 9,927,722, 2018
12018
High-resolution phase and amplitude modulation using a digital micromirror device
SA Goorden, J Bertolotti, H Yılmaz, D Akbulut, WL Vos, AP Mosk
The European Conference on Lasers and Electro-Optics, CL_P_14, 2013
12013
Scattering optics resolve nanostructure
J Bertolotti, EG van Putten, D Akbulut, WL Vos, A Lagendijk, AP Mosk
Nanoengineering: Fabrication, Properties, Optics, and Devices VIII 8102, 810206, 2011
12011
Focusing light through turbid media by binary amplitude modulation
D Akbulut, TJ Huisman, EG van Putten, WL Vos, AP Mosk
The European Conference on Lasers and Electro-Optics, CK7_5, 2011
12011
Metrology apparatus, lithographic system, and method of measuring a structure
J Ravensbergen, D Akbulut, N Pandey, L Jin
US Patent 10,908,514, 2021
2021
Metrology sensor, lithographic apparatus and method for manufacturing devices
SA Goorden, SR Huisman, D Akbulut, P Alessandro, SGJ Mathijssen
US Patent 10,788,766, 2020
2020
Metrology sensor, lithographic apparatus and method for manufacturing devices
SA Goorden, N Pandey, D Akbulut, P Alessandro, SR Huisman
US Patent App. 16/470,905, 2020
2020
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