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Hongjun YangUSAAVerified email at usaa.com
Jung-Hun Seo (서정훈)Assistant Professor of Materials Design & Innovation, University at BuffaloVerified email at buffalo.edu
Deyin ZhaoUniversity of Texas at Arlington; Semerane Inc.Verified email at uta.edu
Mattias HammarKTH - Royal Institute of TechnologyVerified email at KTH.se
Yi-Chen ShuaiNational Institute of Standards and TechnologyVerified email at nist.gov
Shanhui FanProfessor of Electrical Engineering, Stanford UniversityVerified email at stanford.edu
Richard A. SorefResearch Professor of Engineering, The University of Massachusetts at BostonVerified email at rcn.com
Sang June ChoElectrical Engineering at UW-MadisonVerified email at wisc.edu
Munho KimAssistant Professor of EEE at Nanyang Technological UniversityVerified email at ntu.edu.sg
omar qasaimehProfVerified email at just.edu.jo
Arvinder ChadhaUniversity of Texas at ArlingtonVerified email at mavs.uta.edu
Shaoqin Sarah GongProfessor, University of Wisconsin-Madison, Dept. of Biomedical Engineering and WIDVerified email at engr.wisc.edu
Peichen YuDepartment of Photonics, National Chiao Tung UniversityVerified email at faculty.nctu.edu.tw
George K CellerProfessor of Materials Science, Rutgers UniversityVerified email at rci.rutgers.edu
Sanjay KrishnaProfessor and George R Smith Chair of Engineering, ECE Department, Ohio State UniversityVerified email at osu.edu
Lei Sun 孙磊Detection Technology Inc./ Princeton University/University of Wisconsin Madison/ Tsinghua UniversityVerified email at cn.deetee.com
Gail J BrownAir Force Research LaboratoryVerified email at us.af.mil
Jamie PhillipsArthur F. Thurnau Professor, Electrical Engineering and Computer Science, University of MichiganVerified email at umich.edu
Juejun HuMITVerified email at mit.edu
David J klotzkinBinghamton UniversityVerified email at binghamton.edu