Richard C. Jaeger
Richard C. Jaeger
Distinguished University Professor (Emeritus), Auburn University
Verified email at - Homepage
Cited by
Cited by
Introduction to microelectronic fabrication
RC Jaeger
Prentice Hall, 2002
Microelectronic circuit design
RC Jaeger, TN Blalock
McGraw-Hill, 1997
Heat sink optimization with application to microchannels
RW Knight, DJ Hall, JS Goodling, RC Jaeger
IEEE Transactions on Components, Hybrids, and Manufacturing Technology 15 (5 …, 1992
Silicon piezoresistive stress sensors and their application in electronic packaging
JC Suhling, RC Jaeger
IEEE sensors journal 1 (1), 14-30, 2001
A high-speed clamped bit-line current-mode sense amplifier
TN Blalock, RC Jaeger
IEEE Journal of Solid-State Circuits 26 (4), 542-548, 1991
Piezoresistive stress sensors for structural analysis of electronic packages
DA Bittle, JC Suhling, RE Beaty, RC Jaeger, RW Johnson
A 12-Bit Vernier Ring Time-to-Digital Converter in 0.13CMOS Technology
J Yu, FF Dai, RC Jaeger
IEEE journal of solid-state circuits 45 (4), 830-842, 2010
CMOS stress sensors on [100] silicon
RC Jaeger, JC Suhling, R Ramani, AT Bradley, J Xu
IEEE journal of solid-state circuits 35 (1), 85-95, 2000
Piezoresistive characteristics of short-channel MOSFETs on (100) silicon
AT Bradley, RC Jaeger, JC Suhling, KJ O'Connor
IEEE Transactions on electron devices 48 (9), 2009-2015, 2001
A high-speed sensing scheme for 1T dynamic RAMs utilizing the clamped bit-line sense amplifier
TN Blalock, RC Jaeger
IEEE Journal of Solid-State Circuits 27 (4), 618-625, 1992
Evaluation of piezoresistive coefficient variation in silicon stress sensors using a four-point bending test fixture
RE Beaty, RC Jaeger, JC Suhling, RW Johnson, RD Butler
IEEE Transactions on Components Hybrids and Manufacturing Technology 15 (5 …, 1992
Errors associated with the design, calibration and application of piezoresistive stress sensors in (100) silicon
RC Jaeger, JC Suhling, R Ramani
IEEE Transactions on Components, Packaging, and Manufacturing Technology …, 1994
Comments on" An optimized output stage for MOS integrated circuits"[with reply]
RC Jaeger, LW Linholm
IEEE Journal of Solid-State Circuits 10 (3), 185-186, 1975
Temperature dependent threshold behavior of depletion mode MOSFETs: characterization and simulation
FH Gaensslen, RC Jaeger
Solid-State Electronics 22 (4), 423-430, 1979
The van der Pauw stress sensor
A Mian, JC Suhling, RC Jaeger
IEEE Sensors Journal 6 (2), 340-356, 2006
Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors
LS Vempati, JD Cressler, JA Babcock, RC Jaeger, DL Harame
IEEE journal of solid-state circuits 31 (10), 1458-1467, 1996
Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From C to C
CH Cho, RC Jaeger, JC Suhling
IEEE Sensors Journal 8 (8), 1455-1468, 2008
Simulation of impurity freezeout through numerical solution of Poisson's equation with application to MOS device behavior
RC Jaeger, FH Gaensslen
IEEE Transactions on Electron Devices 27 (5), 914-920, 1980
Thermally induced errors in the application of silicon piezoresistive stress sensors
RC Jaeger, JC Suhling, R Ramani
the Advances in Electronic Packaging, 457-470, 1993
Effect of nucleation site spacing on the pool boiling characteristics of a structured surface
ND Nimkar, SH Bhavnani, RC Jaeger
International journal of heat and mass transfer 49 (17-18), 2829-2839, 2006
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