Mariane Comte
Title
Cited by
Cited by
Year
A simulator of small-delay faults caused by resistive-open defects
A Czutro, N Houarche, P Engelke, I Polian, M Comte, M Renovell, ...
2008 13th European Test Symposium, 113-118, 2008
532008
Making predictive analog/RF alternate test strategy independent of training set size
H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell
2012 IEEE International Test Conference, 1-9, 2012
362012
Smart selection of indirect parameters for DC-based alternate RF IC testing
H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ...
2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012
342012
A new methodology for ADC test flow optimization
S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell
International Test Conference, 201-209, 2003
272003
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs
V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell
IEEE Design & Test of Computers 23 (3), 234-243, 2006
182006
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs
V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell
IEEE Design & Test of Computers 23 (3), 234-243, 2006
182006
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies
S Larguech, F Azaïs, S Bernard, M Comte, V Kerzérho, M Renovell
Microelectronics Journal 46 (11), 1091-1102, 2015
162015
Securing color information of an image by concealing the color palette
M Chaumont, W Puech, C Lahanier
Journal of Systems and Software 86 (3), 809-825, 2013
152013
Efficiency of spectral-based ADC test flows to detect static errors
S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell
Journal of Electronic Testing 20 (3), 257-267, 2004
132004
" Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
V Kerzerho, P Cauvet, S Bernard, F Azaïs, M Comte, M Renovell
Eleventh IEEE European Test Symposium (ETS'06), 159-164, 2006
122006
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect
A Karel, M Comte, JM Galliere, F Azaïs, M Renovell
2016 17th Latin-American Test Symposium (LATS), 129-134, 2016
112016
MIRID: Mixed-mode IR-drop induced delay simulator
J Jiang, M Aparicio, M Comte, F Azaïs, M Renovell, I Polian
2013 22nd Asian Test Symposium, 177-182, 2013
112013
Correlation between static and dynamic parameters of A-to-D converters: in the view of a unique test procedure
F Azaïs, S Bernard, Y Bertrand, M Comte, M Renovell
Journal of Electronic Testing 20 (4), 375-387, 2004
112004
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC
V Kerzérho, S Bernard, F Azaïs, M Comte, O Potin, C Shan, G Bontorin, ...
microelectronics Journal 44 (9), 840-843, 2013
82013
Estimating static parameters of A-to-D converters from spectral analysis
F Azaïs, S Bernard, Y Bertrand, M Comte, M Renovell, M Lubaszewski
LATW'02: 3rd IEEE Latin American Test Workshop, pp. 174-179, 2008
82008
Analyzing the memory effect of resistive open in CMOS random logic
M Renovell, M Comte, I Polian, P Engelke, B Becker
International Conference on Design and Test of Integrated Systems in …, 2006
82006
On the use of redundancy to reduce prediction error in alternate analog/RF test
H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell
2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test …, 2012
72012
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations
A Karel, M Comte, JM Galliere, F Azais, M Renovell
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016
62016
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations
A Karel, M Comte, JM Galliere, F Azais, M Renovell
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016
62016
Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing
S Larguech, F Azais, S Bernard, V Kerzerho, M Comte, M Renovell
2014 15th Latin American Test Workshop-LATW, 1-6, 2014
62014
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