Real-time panoptic segmentation from dense detections R Hou, J Li, A Bhargava, A Raventos, V Guizilini, C Fang, J Lynch, ... Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020 | 72 | 2020 |
Optimization of a virtual EUV photoresist for the trade-off between throughput and CDU MD Smith, J Biafore, C Fang Advances in Resist Materials and Processing Technology XXX 8682, 7-18, 2013 | 28 | 2013 |
Pillarflow: End-to-end birds-eye-view flow estimation for autonomous driving KH Lee, M Kliemann, A Gaidon, J Li, C Fang, S Pillai, W Burgard 2020 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2020 | 19 | 2020 |
A physics-based model for negative tone development materials C Fang, MD Smith, S Robertson, JJ Biafore, AV Pret Journal of Photopolymer Science and Technology 27 (1), 53-59, 2014 | 13 | 2014 |
Investigation of interactions between metrology and lithography with a CD SEM simulator MD Smith, C Fang, JJ Biafore, AV Pret, SA Robertson Advances in Patterning Materials and Processes XXXI 9051, 23-33, 2014 | 12 | 2014 |
Finite element analysis of single-walled carbon nanotubes based on a rod model including in-plane cross-sectional deformation C Fang, A Kumar, S Mukherjee International Journal of Solids and Structures 50 (1), 49-56, 2013 | 12 | 2013 |
A finite element analysis of single-walled carbon nanotube deformation C Fang, A Kumar, S Mukherjee | 12 | 2011 |
Pillarflow: End-to-end birds-eye-view flow estimation for autonomous driving. In 2020 IEEE KH Lee, M Kliemann, A Gaidon, J Li, C Fang, S Pillai, W Burgard RSJ International Conference on Intelligent Robots and Systems (IROS), 2007-2013, 0 | 6 | |
A compact physical CD-SEM simulator for IC photolithography modeling applications C Fang, MD Smith, AV Pret, JJ Biafore, SA Robertson, J Bekaert Scanning Microscopies 2014 9236, 208-218, 2014 | 4 | 2014 |
Gaining insight into effective metrology height through the use of a compact CDSEM model for lithography simulation C Fang, T Graves, AV Pret, S Robertson, M Smith Metrology, Inspection, and Process Control for Microlithography XXX 9778, 98-110, 2016 | 3 | 2016 |
Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations C Fang, AV Pret, MD Smith, JJ Biafore, SA Robertson, J Bekaert Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015 | 2 | 2015 |
Systems and methods for vehicle light signal classification JE Pan, KH Lee, C Fang, KH Chen, A Bhargava, S Pillai US Patent App. 17/192,443, 2022 | 1 | 2022 |
System and method for determining if a vehicle is parked C Fang, KH Lee, LM Ellis, JE Pan, KH Chen, S Pillai, D Molinari, ... US Patent 11,810,367, 2023 | | 2023 |
Systems and methods for generating uniform frames having sensor and agent data C Fang, CC Ochoa, KH Lee, KH Chen, V Kumar US Patent App. 17/733,476, 2023 | | 2023 |
Parked car classification based on a velocity estimation KH Lee, CC Ochoa, A Bhargava, C Fang US Patent App. 17/732,393, 2023 | | 2023 |
Shared vision system backbone A Bhargava, C Fang, CC Ochoa, KH Chen, KH Lee, V Guizilini US Patent App. 17/732,421, 2023 | | 2023 |
Systems and methods for detecting traffic lights corresponding to a driving lane KH Chen, KH Lee, C Fang, CC Ochoa US Patent App. 17/731,433, 2023 | | 2023 |
Traffic signal understandings and representation for prediction, planning, and control KH Lee, CC Ochoa, A Bhargava, C Fang, KH Chen US Patent App. 17/732,376, 2023 | | 2023 |
Method for generating radar projections to represent angular uncertainty CC Ochoa, A Bhargava, C Fang, KH Chen, KH Lee US Patent App. 17/731,021, 2023 | | 2023 |
Vehicle taillight recognition based on a velocity estimation KH Lee, CC Ochoa, A Bhargava, C Fang US Patent App. 17/732,401, 2023 | | 2023 |