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Chao Fang
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Real-time panoptic segmentation from dense detections
R Hou, J Li, A Bhargava, A Raventos, V Guizilini, C Fang, J Lynch, ...
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2020
722020
Optimization of a virtual EUV photoresist for the trade-off between throughput and CDU
MD Smith, J Biafore, C Fang
Advances in Resist Materials and Processing Technology XXX 8682, 7-18, 2013
282013
Pillarflow: End-to-end birds-eye-view flow estimation for autonomous driving
KH Lee, M Kliemann, A Gaidon, J Li, C Fang, S Pillai, W Burgard
2020 IEEE/RSJ International Conference on Intelligent Robots and Systems …, 2020
192020
A physics-based model for negative tone development materials
C Fang, MD Smith, S Robertson, JJ Biafore, AV Pret
Journal of Photopolymer Science and Technology 27 (1), 53-59, 2014
132014
Investigation of interactions between metrology and lithography with a CD SEM simulator
MD Smith, C Fang, JJ Biafore, AV Pret, SA Robertson
Advances in Patterning Materials and Processes XXXI 9051, 23-33, 2014
122014
Finite element analysis of single-walled carbon nanotubes based on a rod model including in-plane cross-sectional deformation
C Fang, A Kumar, S Mukherjee
International Journal of Solids and Structures 50 (1), 49-56, 2013
122013
A finite element analysis of single-walled carbon nanotube deformation
C Fang, A Kumar, S Mukherjee
122011
Pillarflow: End-to-end birds-eye-view flow estimation for autonomous driving. In 2020 IEEE
KH Lee, M Kliemann, A Gaidon, J Li, C Fang, S Pillai, W Burgard
RSJ International Conference on Intelligent Robots and Systems (IROS), 2007-2013, 0
6
A compact physical CD-SEM simulator for IC photolithography modeling applications
C Fang, MD Smith, AV Pret, JJ Biafore, SA Robertson, J Bekaert
Scanning Microscopies 2014 9236, 208-218, 2014
42014
Gaining insight into effective metrology height through the use of a compact CDSEM model for lithography simulation
C Fang, T Graves, AV Pret, S Robertson, M Smith
Metrology, Inspection, and Process Control for Microlithography XXX 9778, 98-110, 2016
32016
Understanding the impact of CD-SEM artifacts on metrology via experiments and simulations
C Fang, AV Pret, MD Smith, JJ Biafore, SA Robertson, J Bekaert
Metrology, Inspection, and Process Control for Microlithography XXIX 9424 …, 2015
22015
Systems and methods for vehicle light signal classification
JE Pan, KH Lee, C Fang, KH Chen, A Bhargava, S Pillai
US Patent App. 17/192,443, 2022
12022
System and method for determining if a vehicle is parked
C Fang, KH Lee, LM Ellis, JE Pan, KH Chen, S Pillai, D Molinari, ...
US Patent 11,810,367, 2023
2023
Systems and methods for generating uniform frames having sensor and agent data
C Fang, CC Ochoa, KH Lee, KH Chen, V Kumar
US Patent App. 17/733,476, 2023
2023
Parked car classification based on a velocity estimation
KH Lee, CC Ochoa, A Bhargava, C Fang
US Patent App. 17/732,393, 2023
2023
Shared vision system backbone
A Bhargava, C Fang, CC Ochoa, KH Chen, KH Lee, V Guizilini
US Patent App. 17/732,421, 2023
2023
Systems and methods for detecting traffic lights corresponding to a driving lane
KH Chen, KH Lee, C Fang, CC Ochoa
US Patent App. 17/731,433, 2023
2023
Traffic signal understandings and representation for prediction, planning, and control
KH Lee, CC Ochoa, A Bhargava, C Fang, KH Chen
US Patent App. 17/732,376, 2023
2023
Method for generating radar projections to represent angular uncertainty
CC Ochoa, A Bhargava, C Fang, KH Chen, KH Lee
US Patent App. 17/731,021, 2023
2023
Vehicle taillight recognition based on a velocity estimation
KH Lee, CC Ochoa, A Bhargava, C Fang
US Patent App. 17/732,401, 2023
2023
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