An experimental analysis of power and delay signal-to-noise requirements for detecting Trojans and methods for achieving the required detection sensitivities C Lamech, RM Rad, M Tehranipoor, J Plusquellic IEEE Transactions on Information Forensics and Security 6 (3), 1170-1179, 2011 | 84 | 2011 |
Distribution Network Reconfiguration For Loss Reduction Using Ant Colony System Algorithm LC Daniel, IH Khan, S Ravichandran INDICON, 2005 Annual IEEE, 619-622, 2005 | 57 | 2005 |
Trojan detection based on delay variations measured using a high-precision, low-overhead embedded test structure C Lamech, J Plusquellic 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 75-82, 2012 | 45 | 2012 |
On detecting delay anomalies introduced by hardware trojans D Ismari, J Plusquellic, C Lamech, S Bhunia, F Saqib 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-7, 2016 | 40 | 2016 |
REBEL and TDC: Two embedded test structures for on-chip measurements of within-die path delay variations C Lamech, J Aarestad, J Plusquellic, R Rad, K Agarwal Proceedings of the International Conference on Computer-Aided Design, 170-177, 2010 | 33 | 2010 |
Stability analysis of a physical unclonable function based on metal resistance variations J Ju, R Chakraborty, C Lamech, J Plusquellic 2013 IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013 | 30 | 2013 |
A transmission gate physical unclonable function and on-chip voltage-to-digital conversion technique R Chakraborty, C Lamech, D Acharyya, J Plusquellic Proceedings of the 50th Annual Design Automation Conference, 1-10, 2013 | 23 | 2013 |
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect J Aarestad, C Lamech, J Plusquellic, D Acharyya, K Agarwal Proceedings of the 48th Design Automation Conference, 534-539, 2011 | 10 | 2011 |
Within-die delay variation measurement and power transient analysis using REBEL F Saqib, D Ismari, C Lamech, J Plusquellic IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (4), 776-780, 2014 | 9 | 2014 |
A truly embedded test structure for design-for-manufacturability, hardware security and VLSI testing CD Lamech The University of New Mexico, 2012 | | 2012 |
A Supply Voltage and Temperature Variation-Tolerant Relaxation Oscillator for Biomedical Systems Based on Dynamic Threshold and Switched Resistors........................... Z … H Liang, W Zhang, J Huang, S Yang, P Gupta, D Rossi, M Omaña, ... | | |