| Cantilever-based sensing: the origin of surface stress and optimization strategies M Godin, V Tabard-Cossa, Y Miyahara, T Monga, PJ Williams, ... Nanotechnology 21 (7), 075501, 2010 | 155 | 2010 |
| Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy R Stomp, Y Miyahara, S Schaer, Q Sun, H Guo, P Grutter, S Studenikin, ... Physical review letters 94 (5), 056802, 2005 | 144 | 2005 |
| Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot SD Bennett, L Cockins, Y Miyahara, P Grütter, AA Clerk Physical review letters 104 (1), 017203, 2010 | 92 | 2010 |
| Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy L Cockins, Y Miyahara, SD Bennett, AA Clerk, S Studenikin, P Poole, ... Proceedings of the National Academy of Sciences 107 (21), 9496-9501, 2010 | 90 | 2010 |
| Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation Y Miyahara, M Deschler, T Fujii, S Watanabe, H Bleuler Applied surface science 188 (3-4), 450-455, 2002 | 53 | 2002 |
| Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy A Labuda, Y Miyahara, L Cockins, PH Grütter Physical Review B 84 (12), 125433, 2011 | 52 | 2011 |
| From tunneling to point contact: Correlation between forces and current Y Sun, H Mortensen, S Schär, AS Lucier, Y Miyahara, P Grütter, W Hofer Physical Review B 71 (19), 193407, 2005 | 51 | 2005 |
| Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments A Labuda, K Kobayashi, Y Miyahara, P Grütter Review of Scientific Instruments 83 (5), 053703, 2012 | 50 | 2012 |
| Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques SA Burke, JM LeDue, Y Miyahara, JM Topple, S Fostner, P Grütter Nanotechnology 20 (26), 264012, 2009 | 49 | 2009 |
| Lead zirconate titanate cantilever for noncontact atomic force microscopy Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, ... Applied surface science 140 (3-4), 428-431, 1999 | 46 | 1999 |
| Minimum threshold for incipient plasticity in the atomic-scale nanoindentation of Au (111) W Paul, D Oliver, Y Miyahara, PH Grütter Physical review letters 110 (13), 135506, 2013 | 45 | 2013 |
| Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope T Hagedorn, ME Ouali, W Paul, D Oliver, Y Miyahara, P Grütter Review of Scientific Instruments 82 (11), 113903, 2011 | 31 | 2011 |
| Measurement of surface photovoltage by atomic force microscopy under pulsed illumination Z Schumacher, Y Miyahara, A Spielhofer, P Grutter Physical Review Applied 5 (4), 044018, 2016 | 30 | 2016 |
| The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach Z Schumacher, A Spielhofer, Y Miyahara, P Grutter Applied Physics Letters 110 (5), 053111, 2017 | 27 | 2017 |
| Tip-induced artifacts in magnetic force microscopy images O Iglesias-Freire, JR Bates, Y Miyahara, A Asenjo, PH Grütter Applied Physics Letters 102 (2), 022417, 2013 | 26 | 2013 |
| Stochastic noise in atomic force microscopy A Labuda, M Lysy, W Paul, Y Miyahara, P Grütter, R Bennewitz, M Sutton Physical Review E 86 (3), 031104, 2012 | 25 | 2012 |
| Implementation of atomically defined field ion microscopy tips in scanning probe microscopy W Paul, Y Miyahara, P Grütter Nanotechnology 23 (33), 335702, 2012 | 25 | 2012 |
| Excited-state spectroscopy on an individual quantum dot using atomic force microscopy L Cockins, Y Miyahara, SD Bennett, AA Clerk, P Grutter Nano letters 12 (2), 709-713, 2012 | 25 | 2012 |
| Controlled deposition of gold nanodots using non-contact atomic force microscopy ME Pumarol, Y Miyahara, R Gagnon, P Grütter Nanotechnology 16 (8), 1083, 2005 | 25 | 2005 |
| Quantum state readout of individual quantum dots by electrostatic force detection Y Miyahara, A Roy-Gobeil, P Grutter Nanotechnology 28 (6), 064001, 2017 | 24 | 2017 |
Peter GrutterPhysicsVerified email at physics.mcgill.ca
