Yoichi Miyahara
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Cantilever-based sensing: the origin of surface stress and optimization strategies
M Godin, V Tabard-Cossa, Y Miyahara, T Monga, PJ Williams, ...
Nanotechnology 21 (7), 075501, 2010
Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy
R Stomp, Y Miyahara, S Schaer, Q Sun, H Guo, P Grutter, S Studenikin, ...
Physical review letters 94 (5), 056802, 2005
Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot
SD Bennett, L Cockins, Y Miyahara, P Grütter, AA Clerk
Physical review letters 104 (1), 017203, 2010
Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy
L Cockins, Y Miyahara, SD Bennett, AA Clerk, S Studenikin, P Poole, ...
Proceedings of the National Academy of Sciences 107 (21), 9496-9501, 2010
Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation
Y Miyahara, M Deschler, T Fujii, S Watanabe, H Bleuler
Applied surface science 188 (3-4), 450-455, 2002
Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy
A Labuda, Y Miyahara, L Cockins, PH Grütter
Physical Review B 84 (12), 125433, 2011
From tunneling to point contact: Correlation between forces and current
Y Sun, H Mortensen, S Schär, AS Lucier, Y Miyahara, P Grütter, W Hofer
Physical Review B 71 (19), 193407, 2005
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments
A Labuda, K Kobayashi, Y Miyahara, P Grütter
Review of Scientific Instruments 83 (5), 053703, 2012
Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques
SA Burke, JM LeDue, Y Miyahara, JM Topple, S Fostner, P Grütter
Nanotechnology 20 (26), 264012, 2009
Lead zirconate titanate cantilever for noncontact atomic force microscopy
Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, ...
Applied surface science 140 (3-4), 428-431, 1999
Minimum threshold for incipient plasticity in the atomic-scale nanoindentation of Au (111)
W Paul, D Oliver, Y Miyahara, PH Grütter
Physical review letters 110 (13), 135506, 2013
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
T Hagedorn, ME Ouali, W Paul, D Oliver, Y Miyahara, P Grütter
Review of Scientific Instruments 82 (11), 113903, 2011
Measurement of surface photovoltage by atomic force microscopy under pulsed illumination
Z Schumacher, Y Miyahara, A Spielhofer, P Grutter
Physical Review Applied 5 (4), 044018, 2016
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
Z Schumacher, A Spielhofer, Y Miyahara, P Grutter
Applied Physics Letters 110 (5), 053111, 2017
Tip-induced artifacts in magnetic force microscopy images
O Iglesias-Freire, JR Bates, Y Miyahara, A Asenjo, PH Grütter
Applied Physics Letters 102 (2), 022417, 2013
Stochastic noise in atomic force microscopy
A Labuda, M Lysy, W Paul, Y Miyahara, P Grütter, R Bennewitz, M Sutton
Physical Review E 86 (3), 031104, 2012
Implementation of atomically defined field ion microscopy tips in scanning probe microscopy
W Paul, Y Miyahara, P Grütter
Nanotechnology 23 (33), 335702, 2012
Excited-state spectroscopy on an individual quantum dot using atomic force microscopy
L Cockins, Y Miyahara, SD Bennett, AA Clerk, P Grutter
Nano letters 12 (2), 709-713, 2012
Controlled deposition of gold nanodots using non-contact atomic force microscopy
ME Pumarol, Y Miyahara, R Gagnon, P Grütter
Nanotechnology 16 (8), 1083, 2005
Quantum state readout of individual quantum dots by electrostatic force detection
Y Miyahara, A Roy-Gobeil, P Grutter
Nanotechnology 28 (6), 064001, 2017
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