Masanori Hashimoto
Masanori Hashimoto
Verified email at ist.osaka-u.ac.jp - Homepage
Title
Cited by
Cited by
Year
Adaptive performance compensation with in-situ timing error predictive sensors for subthreshold circuits
H Fuketa, M Hashimoto, Y Mitsuyama, T Onoye
IEEE Transactions on very large scale integration (VLSI) systems 20 (2), 333-343, 2011
712011
A performance optimization method by gate resizing based on statistical static timing analysis
M Hashimoto, H Onodera
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and …, 2000
652000
Neutron induced single event multiple transients with voltage scaling and body biasing
R Harada, Y Mitsuyama, M Hashimoto, T Onoye
2011 International Reliability Physics Symposium, 3C. 4.1-3C. 4.5, 2011
642011
On-chip thermal gradient analysis and temperature flattening for SoC design
T Sato, J Ichimiya, N Ono, K Hachiya, M Hashimoto
IEICE Transactions on Fundamentals of Electronics, Communications and …, 2005
572005
Modeling the overshooting effect for CMOS inverter delay analysis in nanometer technologies
Z Huang, A Kurokawa, M Hashimoto, T Sato, M Jiang, Y Inoue
IEEE transactions on computer-aided design of integrated circuits and …, 2010
492010
A performance comparison of PLLs for clock generation using ring oscillator VCO and LC oscillator in a digital CMOS process
T Miyazaki, M Hashimoto, H Onodera
ASP-DAC 2004: Asia and South Pacific Design Automation Conference 2004 (IEEE …, 2004
482004
Statistical analysis of clock skew variation in H-tree structure
M Hashimoto, T Yamamoto, H Onodera
Sixth international symposium on quality electronic design (isqed'05), 402-407, 2005
452005
All-digital ring-oscillator-based macro for sensing dynamic supply noise waveform
Y Ogasahara, M Hashimoto, T Onoye
IEEE journal of solid-state circuits 44 (6), 1745-1755, 2009
432009
Increase in delay uncertainty by performance optimization
M Hashimoto, H Onodeva
ISCAS 2001. The 2001 IEEE International Symposium on Circuits and Systems …, 2001
432001
Equivalent waveform propagation for static timing analysis
M Hashimoto, Y Yamada, H Onodera
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
412004
Coarse-grained dynamically reconfigurable architecture with flexible reliability
D Alnajiar, Y Ko, T Imagawa, H Konoura, M Hiromoto, Y Mitsuyama, ...
2009 International Conference on Field Programmable Logic and Applications …, 2009
392009
Effects of on-chip inductance on power distribution grid
A Muramatsu, M Hashimoto, H Onodera
IEICE transactions on fundamentals of electronics, communications and …, 2005
382005
Post-layout transistor sizing for power reduction in cell-base design
M Hashimoto, H Onodera
IEICE Transactions on Fundamentals of Electronics, Communications and …, 2001
382001
Implementing flexible reliability in a coarse-grained reconfigurable architecture
D Alnajjar, H Konoura, Y Ko, Y Mitsuyama, M Hashimoto, T Onoye
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (12 …, 2012
372012
Statistical timing analysis considering spatially and temporally correlated dynamic power supply noise
T Enami, S Ninomiya, M Hashimoto
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2009
362009
Validation of a full-chip simulation model for supply noise and delay dependence on average voltage drop with on-chip delay measurement
Y Ogasahara, T Enami, M Hashimoto, T Sato, T Onoye
IEEE Transactions on Circuits and Systems II: Express Briefs 54 (10), 868-872, 2007
362007
A power optimization method considering glitch reduction by gate sizing
M Hashimoto, H Onodera, K Tamaru
Proceedings of the 1998 international symposium on Low power electronics and …, 1998
361998
Timing analysis considering temporal supply voltage fluctuation
M Hashimoto, J Yamaguchi, T Sato, H Onodera
IEICE TRANSACTIONS on Information and Systems 91 (3), 655-660, 2008
332008
Measurement circuits for acquiring SET pulse width distribution with sub-FO1-inverter-delay resolution
R Harada, Y Mitsuyama, M Hashimoto, T Onoye
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and …, 2010
322010
Alpha-particle-induced soft errors and multiple cell upsets in 65-nm 10T subthreshold SRAM
H Fuketa, M Hashimoto, Y Mitsuyama, T Onoye
2010 IEEE International Reliability Physics Symposium, 213-217, 2010
312010
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Articles 1–20