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Co-authors
- Hideki HosodaTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- tomonari inamuraTokyo Institute of TechnologyVerified email at pi.titech.ac.jp
- Shuichi MiyazakiUniversity of TsukubaVerified email at ims.tsukuba.ac.jp
- Wan-ting ChiuTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Hee Young KIMUniversity of TsukubaVerified email at ims.tsukuba.ac.jp
- Akira Umise東京工業大学Verified email at m.titech.ac.jp
- Naoki NohiraTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Yuri ShinoharaThe University of Electro-CommunicationsVerified email at uec.ac.jp
- Volodymyr ChernenkoIkerbasque research professor, BCMaterials & University of Basque CountryVerified email at ehu.eus
- Pimpet Sratong-OnFaculty of Engineering, Thai-Nichi Institute of TechnologyVerified email at tni.ac.th
- Masato Sone (曽根 正人)Tokyo Institute of TechnologyVerified email at pi.titech.ac.jp
- Kentaro NakamuraTokyo Institute of tecnlogyVerified email at sonic.pi.titech.ac.jp
- Yosuke MizunoYokohama National UniversityVerified email at ynu.ac.jp
- Tso-Fu Mark ChangTokyo Institute of TechnologyVerified email at m.titech.ac.jp
- Tae-hyun NamGyeongsang National UniversityVerified email at gnu.ac.kr