Adedapo Oni
Adedapo Oni
Verified email at intel.com
Title
Cited by
Cited by
Year
Spin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCo
C Niu, AJ Zaddach, AA Oni, X Sang, JW Hurt III, JM LeBeau, CC Koch, ...
Applied Physics Letters 106 (16), 161906, 2015
1212015
Atom column indexing: atomic resolution image analysis through a matrix representation
X Sang, AA Oni, JM LeBeau
Microscopy and Microanalysis 20 (6), 1764-1771, 2014
492014
Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy
JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, ...
Microscopy and Microanalysis 21 (4), 946-952, 2015
312015
Structure and magnetic properties of a multi-principal element Ni–Fe–Cr–Co–Zn–Mn alloy
AJ Zaddach, C Niu, AA Oni, M Fan, JM LeBeau, DL Irving, CC Koch
Intermetallics 68, 107-112, 2016
282016
Effect of B and Cr on elastic strength and crystal structure of Ni3Al alloys under high pressure
SV Raju, AA Oni, BK Godwal, J Yan, V Drozd, S Srinivasan, JM LeBeau, ...
Journal of Alloys and Compounds 619, 616-620, 2015
222015
The role of terminal oxide structure and properties in nanothermite reactions
EJ Mily, A Oni, JM LeBeau, Y Liu, HJ Brown-Shaklee, JF Ihlefeld, ...
Thin Solid Films 562, 405-410, 2014
222014
Large area strain analysis using scanning transmission electron microscopy across multiple images
AA Oni, X Sang, SV Raju, S Dumpala, S Broderick, A Kumar, S Sinnott, ...
Applied Physics Letters 106 (1), 011601, 2015
202015
Combined experimental and computational methods reveal the evolution of buried interfaces during synthesis of ferroelectric thin films
JL Jones, JM LeBeau, J Nikkel, AA Oni, JH Dycus, C Cozzan, FY Lin, ...
Advanced Materials Interfaces 2 (10), 1500181, 2015
142015
Atom site preference and γ′/γ mismatch strain in NiAlCoTi superalloys
AA Oni, SR Broderick, K Rajan, JM LeBeau
Intermetallics 73, 72-78, 2016
122016
300mm heterogeneous 3D integration of record performance layer transfer germanium PMOS with silicon NMOS for low power high performance logic applications
W Rachmady, A Agrawal, SH Sung, G Dewey, S Chouksey, B Chu-Kung, ...
2019 IEEE International Electron Devices Meeting (IEDM), 29.7. 1-29.7. 4, 2019
92019
Airbrushed Nickel Nanoparticles for Large-Area Growth of Vertically Aligned Carbon Nanofibers on Metal (Al, Cu, Ti) Surfaces
MF Sarac, BD Anderson, RC Pearce, JG Railsback, AA Oni, RM White, ...
ACS Applied Materials & Interfaces 5 (18), 8955-8960, 2013
42013
JWH III, JM LeBeau, CC Koch, DL Irving
C Niu, AJ Zaddach, AA Oni, X Sang
Appl. Phys. Lett 106, 161906, 2015
32015
Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM)
S Dumpala, AA Oni, S Padalkar, SR Broderick, JM LeBeau, K Rajan
Microscopy and Microanalysis 20 (S3), 996-997, 2014
22014
Discovering chemical site occupancy-modulus correlations in Ni based intermetallics via statistical learning methods
SR Broderick, A Kumar, AA Oni, JM LeBeau, SB Sinnott, K Rajan
Computational Condensed Matter 14, 8-14, 2018
12018
Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy
AA Oni
PhDT, 2016
12016
Observing the Interplay Between Composition and Phonon Transport in Bi2Te3-xSex Alloys using ADF STEM
JH Dycus, A Oni, X Sang, T Chan, C Koch, JM LeBeau
Microscopy and Microanalysis 20 (S3), 440-441, 2014
12014
Phase coexistence in Ti6Sn5 intermetallics
AA Oni, D Hook, JP Maria, JM LeBeau
Intermetallics 51, 48-52, 2014
12014
Direct Observation of Chemical Pressure in Intermetallic Alloys by Scanning Transmission Electron Microscopy
AA Oni, X Sang, A Kumar, SB Sinnott, JM LeBeau
Microscopy and Microanalysis 21 (S3), 1519-1520, 2015
2015
Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy
JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, TE Chan, ...
Microscopy and Microanalysis 21 (S3), 2245-2246, 2015
2015
Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors
W Xu, JH Dycus, X Sang, AA Oni, JM LeBeau
Microscopy and Microanalysis 21 (S3), 1091-1092, 2015
2015
The system can't perform the operation now. Try again later.
Articles 1–20