| Spin-driven ordering of Cr in the equiatomic high entropy alloy NiFeCrCo C Niu, AJ Zaddach, AA Oni, X Sang, JW Hurt III, JM LeBeau, CC Koch, ... Applied Physics Letters 106 (16), 161906, 2015 | 121 | 2015 |
| Atom column indexing: atomic resolution image analysis through a matrix representation X Sang, AA Oni, JM LeBeau Microscopy and Microanalysis 20 (6), 1764-1771, 2014 | 49 | 2014 |
| Accurate nanoscale crystallography in real-space using scanning transmission electron microscopy JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, ... Microscopy and Microanalysis 21 (4), 946-952, 2015 | 31 | 2015 |
| Structure and magnetic properties of a multi-principal element Ni–Fe–Cr–Co–Zn–Mn alloy AJ Zaddach, C Niu, AA Oni, M Fan, JM LeBeau, DL Irving, CC Koch Intermetallics 68, 107-112, 2016 | 28 | 2016 |
| Effect of B and Cr on elastic strength and crystal structure of Ni3Al alloys under high pressure SV Raju, AA Oni, BK Godwal, J Yan, V Drozd, S Srinivasan, JM LeBeau, ... Journal of Alloys and Compounds 619, 616-620, 2015 | 22 | 2015 |
| The role of terminal oxide structure and properties in nanothermite reactions EJ Mily, A Oni, JM LeBeau, Y Liu, HJ Brown-Shaklee, JF Ihlefeld, ... Thin Solid Films 562, 405-410, 2014 | 22 | 2014 |
| Large area strain analysis using scanning transmission electron microscopy across multiple images AA Oni, X Sang, SV Raju, S Dumpala, S Broderick, A Kumar, S Sinnott, ... Applied Physics Letters 106 (1), 011601, 2015 | 20 | 2015 |
| Combined experimental and computational methods reveal the evolution of buried interfaces during synthesis of ferroelectric thin films JL Jones, JM LeBeau, J Nikkel, AA Oni, JH Dycus, C Cozzan, FY Lin, ... Advanced Materials Interfaces 2 (10), 1500181, 2015 | 14 | 2015 |
| Atom site preference and γ′/γ mismatch strain in NiAlCoTi superalloys AA Oni, SR Broderick, K Rajan, JM LeBeau Intermetallics 73, 72-78, 2016 | 12 | 2016 |
| 300mm heterogeneous 3D integration of record performance layer transfer germanium PMOS with silicon NMOS for low power high performance logic applications W Rachmady, A Agrawal, SH Sung, G Dewey, S Chouksey, B Chu-Kung, ... 2019 IEEE International Electron Devices Meeting (IEDM), 29.7. 1-29.7. 4, 2019 | 9 | 2019 |
| Airbrushed Nickel Nanoparticles for Large-Area Growth of Vertically Aligned Carbon Nanofibers on Metal (Al, Cu, Ti) Surfaces MF Sarac, BD Anderson, RC Pearce, JG Railsback, AA Oni, RM White, ... ACS Applied Materials & Interfaces 5 (18), 8955-8960, 2013 | 4 | 2013 |
| JWH III, JM LeBeau, CC Koch, DL Irving C Niu, AJ Zaddach, AA Oni, X Sang Appl. Phys. Lett 106, 161906, 2015 | 3 | 2015 |
| Correlative Imaging of Stacking Faults using Atom Probe Tomography (APT) and Scanning Transmission Electron Microscopy (STEM) S Dumpala, AA Oni, S Padalkar, SR Broderick, JM LeBeau, K Rajan Microscopy and Microanalysis 20 (S3), 996-997, 2014 | 2 | 2014 |
| Discovering chemical site occupancy-modulus correlations in Ni based intermetallics via statistical learning methods SR Broderick, A Kumar, AA Oni, JM LeBeau, SB Sinnott, K Rajan Computational Condensed Matter 14, 8-14, 2018 | 1 | 2018 |
| Atomic Metrology in Ordered/Disordered Systems Using Scanning Transmission Electron Microscopy AA Oni PhDT, 2016 | 1 | 2016 |
| Observing the Interplay Between Composition and Phonon Transport in Bi2Te3-xSex Alloys using ADF STEM JH Dycus, A Oni, X Sang, T Chan, C Koch, JM LeBeau Microscopy and Microanalysis 20 (S3), 440-441, 2014 | 1 | 2014 |
| Phase coexistence in Ti6Sn5 intermetallics AA Oni, D Hook, JP Maria, JM LeBeau Intermetallics 51, 48-52, 2014 | 1 | 2014 |
| Direct Observation of Chemical Pressure in Intermetallic Alloys by Scanning Transmission Electron Microscopy AA Oni, X Sang, A Kumar, SB Sinnott, JM LeBeau Microscopy and Microanalysis 21 (S3), 1519-1520, 2015 | | 2015 |
| Highly Accurate Real Space Nanometrology Using Revolving Scanning Transmission Electron Microscopy JH Dycus, JS Harris, X Sang, CM Fancher, SD Findlay, AA Oni, TE Chan, ... Microscopy and Microanalysis 21 (S3), 2245-2246, 2015 | | 2015 |
| Effect of Specimen Geometry on Quantitative EDS Analysis with Four-Quadrant Super-X Detectors W Xu, JH Dycus, X Sang, AA Oni, JM LeBeau Microscopy and Microanalysis 21 (S3), 1091-1092, 2015 | | 2015 |
Douglas L IrvingNorth Carolina State UniversityVerified email at ncsu.edu
