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Omur E. DAGDEVIREN
Omur E. DAGDEVIREN
École de technologie supérieure, University of Quebec
Verified email at yale.edu - Homepage
Title
Cited by
Cited by
Year
Role of double layers at the interface of FeSe/ superconductors
K Zou, S Mandal, SD Albright, R Peng, Y Pu, D Kumah, C Lau, GH Simon, ...
Physical Review B 93 (18), 180506, 2016
492016
Atomic imprinting into metallic glasses
R Li, Z Chen, A Datye, GH Simon, J Ketkaew, E Kinser, Z Liu, C Zhou, ...
Communications Physics 1 (1), 75, 2018
432018
Growth of two dimensional silica and aluminosilicate bilayers on Pd (111): from incommensurate to commensurate crystalline
JH Jhang, C Zhou, OE Dagdeviren, GS Hutchings, UD Schwarz, ...
Physical Chemistry Chemical Physics 19 (21), 14001-14011, 2017
432017
Surface phase, morphology, and charge distribution transitions on vacuum and ambient annealed (100)
OE Dagdeviren, GH Simon, K Zou, FJ Walker, C Ahn, EI Altman, ...
Physical Review B 93 (19), 195303, 2016
402016
Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction
MZ Baykara, OE Dagdeviren, TC Schwendemann, H Mönig, EI Altman, ...
Beilstein journal of nanotechnology 3, 637, 2012
342012
Robust high-resolution imaging and quantitative force measurement with tuned-oscillator atomic force microscopy
OE Dagdeviren, J Götzen, H Hölscher, EI Altman, UD Schwarz
Nanotechnology 27 (6), 065703, 2016
302016
The Effect of Photoinduced Surface Oxygen Vacancies on the Charge Carrier Dynamics in TiO2 Films
OE Dagdeviren, D Glass, R Sapienza, E Cortés, SA Maier, IP Parkin, ...
Nano Letters 21 (19), 8348-8354, 2021
292021
Review of time-resolved non-contact electrostatic force microscopy techniques with applications to ionic transport measurements
A Mascaro, Y Miyahara, T Enright, OE Dagdeviren, P Grütter
Beilstein Journal of Nanotechnology 10 (1), 617-633, 2019
252019
Quantifying Tip-Sample Interactions in Vacuum Using Cantilever-Based Sensors: An Analysis
OE Dagdeviren, C Zhou, EI Altman, UD Schwarz
Physical Review Applied 9 (4), 044040, 2018
232018
Atomic-scale homogeneous plastic flow beyond near-theoretical yield stress in a metallic glass
J Yu, A Datye, Z Chen, C Zhou, OE Dagdeviren, J Schroers, UD Schwarz
Communications Materials 2 (1), 22, 2021
142021
Direct imaging, three-dimensional interaction spectroscopy, and friction anisotropy of atomic-scale ripples on MoS2
OE Dagdeviren, O Acikgoz, P Grütter, MZ Baykara
npj 2D Materials and Applications 4 (1), 30, 2020
142020
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
OE Dagdeviren, Y Miyahara, A Mascaro, P Grütter
Review of Scientific Instruments 90 (1), 2019
142019
Exploring load, velocity, and surface disorder dependence of friction with one-dimensional and two-dimensional models
OE Dagdeviren
Nanotechnology 29 (31), 315704, 2018
142018
Revealing surface-state transport in ultrathin topological crystalline insulator SnTe films
K Zou, SD Albright, OE Dagdeviren, MD Morales-Acosta, GH Simon, ...
APL Materials 7 (5), 2019
132019
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
OE Dagdeviren, UD Schwarz
Beilstein journal of nanotechnology 8 (1), 657-666, 2017
132017
Relaxation and crystallization studied by observing the surface morphology evolution of atomically flat Pt57. 5Cu14. 7Ni5. 3P22. 5 upon annealing
Z Chen, A Datye, J Ketkaew, S Sohn, C Zhou, OE Dagdeviren, J Schroers, ...
Scripta Materialia 182, 32-37, 2020
122020
Ergodic and nonergodic dynamics of oxygen vacancy migration at the nanoscale in inorganic perovskites
OE Dagdeviren, A Mascaro, S Yuan, J Shirani, KH Bevan, P Grutter
Nano Letters 20 (10), 7530-7535, 2020
112020
Accuracy of tip-sample interaction measurements using dynamic atomic force microscopy techniques: Dependence on oscillation amplitude, interaction strength, and tip-sample distance
OE Dagdeviren, UD Schwarz
Review of Scientific Instruments 90 (3), 2019
112019
Length scale and dimensionality of defects in epitaxial SnTe topological crystalline insulator films
OE Dagdeviren, C Zhou, K Zou, GH Simon, SD Albright, S Mandal, ...
Advanced Materials Interfaces 4 (2), 1601011, 2017
112017
Numerical performance analysis of quartz tuning fork-based force sensors
OE Dagdeviren, UD Schwarz
Measurement Science and Technology 28 (1), 015102, 2016
102016
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